All Categories (1-7 of 7)

1. Basic Characterization Techniques

   24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

   OutlineIntroductionOptical MicroscopesProfilometryEllipsometryReflective SpectroscopyContact Angle

2. Lab Exercise: Ellipsometry

   18 Jan 2017 | | Contributor(s):: NACK Network

   The objective of this lab is to evaluate the ellipsometer. Multiple ellipsometers will be presented and compared. The procedural operation and working mechanisms of the ellipsometer will both be discussed.

3. 

   Federico Gramazio

   https://nanohub.org/members/131624

4. The PhotonicVASEfit Tutorial

   18 Jun 2015 | | Contributor(s):: Ludmila Prokopeva, Alexander V. Kildishev

   This online presentation will help you to get started with our simulation tool PhotonicVASEfit. In the introduction we explain the scenarios in which the simulation tool can be used. We describe the fitting models and give a demo with complete how-to-use instructions.

5. PhotonicVASEfit: VASE fitting tool

   19 May 2015 | | Contributor(s):: Ludmila Prokopeva, You-Chia Chang, Alexander V. Kildishev (editor)

   Retrieves optical constants of a material by fitting it to VASE (Variable Angle Spectroscopic Ellipsometry) data

6. Spectroscopic Ellipsometry

   out of 5 stars 

   12 Dec 2006 | | Contributor(s):: Lynn Marie Santiago

   This is the fourth contribution from the students in the University of Texas at El Paso Molecular Electronics course given in the fall of 2006.This presentation is presented at the undergraduate level and introduces spectroscopic ellipsometry, which is one of the most important characterization...

7. 

   Zhengtong Liu

   https://nanohub.org/members/17925