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  1. SCALE Single Event Burnout Testing of Power Electronics Devices

    20 Mar 2024 | | Contributor(s):: Arthur F Witulski, Andrew L. Sternberg

  2. Perspectives on Ion-Induced Power Device Burnout in Space

    02 Nov 2023 | | Contributor(s):: Kenneth F. Galloway, Scooter Ball

  3. Power Diode Lab

    21 Nov 2022 | | Contributor(s):: Jing Guo, Ning Yang

    Calculate the critical breakdown electric field, break down voltage, depletion region thickness, and specific on resistance of power diodes.

  4. Luis Contreras

    https://nanohub.org/members/306449

  5. 47 Electrostatic Engineering in BaTiO3/β-Ga2O3 Heterostructure Field Effect Transistors

    14 Oct 2020 | | Contributor(s):: Nidhin Kurian Kalarickal, Zhanbo Xia, Wyatt Moore, Joe McGlone, Aaron R. Arehart, Steven A. Ringel, Siddharth Rajan

    We report on the design and demonstration of BaTiO3/β-Ga2O3 based lateral field effect transistors with superior breakdown performance. Utilizing the high-k low-k dielectric interface allows significant improvement in electrostatic field management giving a breakdown voltage of 1.1 KV at 5...

  6. 09 Demonstration of Vertical GaN PN Diode with Step-etched Triple zone JTE

    14 Oct 2020 | | Contributor(s):: Hyun-Soo Lee, Yuxuan Zhang, Zhaoying Chen, Mohammad Wahidur Rahman, Hongping Zhao, Siddharth Rajan

    We have demonstrated significantly improved BV of vertical GaN PN diode with STJTE without any degradation of forward characteristics. This is the first demonstration of a step-etched multiple zone edge termination for III-Nitride technology.

  7. DRC202 Device Research Conference Technical Presentations

    14 Oct 2020 | | Contributor(s):: Siddharth Rajan (editor), Zhihong Chen (editor), Becky (R. L.) Peterson

    For over seven decades, the Device Research Conference (DRC) has brought together leading scientists, researchers and students to share their latest discoveries in device science, technology and modeling. Notably, many of the first public disclosures of key device technologies were made at the...

  8. 12 The Influence of the Gate Trench Orientation to the crystal Plane on the Conduction Properties of Vertical GaN MISFETs for Laser Driving Applications

    18 Sep 2020 | | Contributor(s):: E. Bahat Treidel, O. Hilt, H. Christopher, A. Klehr, A. Ginolas, A. Liero, J. Würfl

    In this work the development of vertical GaN MISFET technology is focused on pulsed laser driving applications with maximum voltages < 100 V (Fig. 1). Drivers for pulsed lasers are required to deliver very high currents up to 250 A in very short pulse lengths of 3 ns to 10 ns [4].

  9. DRC 2020 Short Course: Devices for IoT – Device Opportunities in the Emerging Era of Internet of Things

    29 Jun 2020 | | Contributor(s):: Swaroop Ghosh, Younghyun Kim, Shreyas Sen, Michael Goldflam (editor), Saptarshi Das (editor)

  10. Abdelaali Fargi

    Abdelaali Fargi received his PhD in Physics of Semiconductor Devices and Electronics from Faculty of Sciences of Monastir (Tunisia) in 2016, the Master of Science Degree in Materials Science and...

    https://nanohub.org/members/56303