Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

By Lee Stauffer

Keithley Instruments, Inc., Cleveland, OH

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Abstract

Measurement Techniques and Optimization (part 2)

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Researchers should cite this work as follows:

  • Lee Stauffer (2011), "Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II," https://nanohub.org/resources/10433.

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Tags

  1. CV curves
  2. Device Characterization
  3. devices
  4. experiments
  5. I-V curves/characteristics
  6. Keithley 4200-SCS
  7. nanoelectronics