Multi-Scale Modeling of Metal-CNT Interfaces

By Martin Claus

Center for Advancing Electronics, Technische Universität Dresden, Dresden, Germany

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IWCE 2015 presentation.  the authors studied the impact of contact materials on cntfet behavior using multiscale modeling and simulation framework. a strong correlation between metal-cnt coupling strength, contact length and contact resistance was found. the atomistic simulation was used to adjust the contact model used within the transport studies at the device level.

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Researchers should cite this work as follows:

  • Claus, Martin, "Multi-scale modeling of metal-CNT interfaces," in Computational Electronics (IWCE) 2015 International Workshop on, DOI: 10.1109/IWCE.2015.7301946

  • Martin Claus (2015), "Multi-Scale Modeling of Metal-CNT Interfaces,"

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