ECE 695Q Lecture 25: Nanofabrication with Focused Ion Beams – Scanning Ion Beam Imaging

By Minghao Qi

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Cite this work

Researchers should cite this work as follows:

  • Minghao Qi (2016), "ECE 695Q Lecture 25: Nanofabrication with Focused Ion Beams – Scanning Ion Beam Imaging," http://nanohub.org/resources/24448.

    BibTex | EndNote

Location

226 Electrical Engineering, Purdue University, West Lafayette, IN

Tags