Theory and characterization of random defect formation and its implication in variability of nanoscale transistors

30 Sep 2011 | Publications | Contributor(s): Ahmad Ehteshamul Islam

Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of the …

http://nanohub.org/resources/12182

Electronic Characterization of Materials Using Conductive AFM

03 May 2011 | Online Presentations | Contributor(s): Amir Moshar

Purdue University Discovery Park, Asylum Research

http://nanohub.org/resources/11020

X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials

29 Dec 2009 | Online Presentations | Contributor(s): Mauro Sardela

A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the …

http://nanohub.org/resources/7955

Graphene Interconnect

17 Mar 2008 | Tools | Contributor(s): Sansiri Tanachutiwat, wei wang, Nicholas Anthony Connelly

Estimate performances of graphene interconnects

http://nanohub.org/resources/4151

PETE : Purdue Emerging Technology Evaluator

26 Jun 2007 | Tools | Contributor(s): Arijit Raychowdhury, Charles Augustine, Yunfei Gao, Mark Lundstrom, Kaushik Roy

Estimate circuit level performance and power of novel devices

http://nanohub.org/resources/2841

Carbon Nanotubes Interconnect Analyzer (CNIA)

14 Mar 2007 | Tools | Contributor(s): Sansiri Tanachutiwat, wei wang

Analyze performances of carbon nanotube bundle interconnects

http://nanohub.org/resources/2464

Nano-CMOS

06 Feb 2007 | Tools | Contributor(s): wei zhao, yu cao

Predictive model files for future transistor technologies.

http://nanohub.org/resources/2327