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Confocal Microscopy for Technicians
12 Oct 2022 | | Contributor(s):: Peter Kazarinoff, Grant Shao, NACK Network
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ECE 695Q Lecture 12: Optical Lithography – Contrast and Resolution in Microscopy and Lithography Systems
06 Jun 2016 | | Contributor(s):: Minghao Qi
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Electron Microscopy
24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlineScanning Electron MicroscopyField Emission Scanning Electron MicroscopyTransmission Electron MicroscopyEnergy Dispersive Spectroscopy
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Exciton Ultrafast Dynamics in Nanomaterials
07 Dec 2023 | | Contributor(s):: Aziz Boulesbaa, The Micro Nano Technology - Education Center
In this talk, I will present our experimental capabilities to study nanomaterials. In particular, femtosecond laser spectroscopy and microscopy will be discussed....
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Extracting Hidden Three-Dimensional Information from Your Fluorescence Microscope
06 Mar 2019 | | Contributor(s):: Mikael Backlund
Here I will focus on two studies that demonstrate this concept. First I will discuss the fundamental limits associated with determining the three-dimensional position of a fluorescent emitter, with insights provided by quantum parameter estimation theory. Second I will show how nitrogen-vacancy...
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Fabrication and Characterization of Nanostructures Using AFM
26 Feb 2022 | | Contributor(s):: Wesley C. Sanders, Glen Johnson, NACK Network
The atomic force microscope (AFM) is a versatile characterization tool that allows users to acquire high-resolution images of nanoscale surface features. In addition to probing nanoscale surface topography, AFMs can be used to print nanoscale structures using additive and subtractive lithographic...
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Focused Ion Beam (FIB): “Seeing” and “Processing” at the Nano-Scale
01 Oct 2018 | | Contributor(s):: Wook Jun Nam, NACK Network
OutlineFIB OverviewFIB OperationFIB Applications
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Fundamentals of Metrology and Characterization for Nanotechnology
13 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network
Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it
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Hands On(line) Lab Education with Remote SEM
27 Sep 2021 | | Contributor(s):: Zackary Gray, Robert Ehrmann, NACK Network
In a year where remote communication and learning has become a necessity, delivering hands-on activities has remained a challenge. During this webinar we will present methods in which students can operate advanced scientific instrumentation without ever needing to leave their home. The...
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Illinois 2009 nano-biophotonics Summer School, Lecture 2: Optics, Microscopy
20 Oct 2009 | | Contributor(s):: Kimani C Toussaint
Optics, MicroscopyTopics: Background Spatial Resolution Microscope Architecture Contrast Optical Sources and detectors Resolution EnhancementVideo Processing and compression done by Kirill Lagoutchev, edited and uploaded by Omar Sobh.
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Illinois ECE 460 Optical Imaging, Chapter 4: Microscopy
28 Jul 2008 | | Contributor(s):: Gabriel Popescu, Andre da Costa Teves, Christopher Nixon, Glen Svenningsen
This chapter presents the main concepts and techniques of Microscopy: Resolution, Contrast, Dark Field Microscopy, Schlieren Method, Phase Contrast Microscopy, Quantitative Phase Microscopy and many other techniques.Notes developed by Professor Gabriel Popescu from University of Illinois at...
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Illinois iOptics Lecture 1: Super Accuracy and Super-Resolution of Molecular Motors and Ion Channels
15 Apr 2010 | | Contributor(s):: Paul R Selvin
The standard diffraction limit of light is about 250 nm, meaning that you cannot "resolve" objects closer than this distance. Despite this, we have come up with a method to measure individual biomolecules with 1.5 nm spatial localization in x-y plane and 1-500 msec temporal resolution,...
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Illinois Tool: FIONA (Fluorescence Imaging with One Nanometer Accuracy)
01 Nov 2010 | | Contributor(s):: Paul R Selvin, Raheem Syed, Nahil Sobh
Fluorescence Imaging with One Nanometer Accuracy
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Illinois Tools: Optical Beam Focusing System
13 Dec 2010 | | Contributor(s):: Zuhaib Bashir Sheikh, Nahil Sobh, Mohammad Hazem Jaber
Generate Focused optical beams using principles of electromagnetic optics
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Introduction of Transmission Electron Microscope
23 Aug 2022 | | Contributor(s):: Nan Yao, NACK Network
For Nanotechnology, Nanobiotechnology, and Nanomaterials characterization and quality control Transmission Electron Microscopy (TEM) is still used for its ability to produce images of relevant features from angstroms to microns. In this course we will discuss the state of the art in TEM...
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Introduction to Birck Scanning Probe Microscopy Center
21 Mar 2011 | | Contributor(s):: Xin Xu
This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.
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Introduction to Field Emission Scanning Electron Microscopy (FESEM)
10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
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Introduction to Scanning Electron Microscopy (SEM)
10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
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Introduction to X-ray Diffraction (XRD)
02 Dec 2022 | | Contributor(s):: Peter Kazarinoff, NACK Network
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Introduction to X-ray Microscopy (XRM): Technology and Applications for Lab-based Non-destructive, High-resolution 3D Imaging and Analysis
22 Jul 2019 | | Contributor(s):: John Kelley
This talk will cover an overview of XRM technology as well as prominent examples and applications.