ECE 695A Reliability Physics of Nanotransistors

Offering: 01a Section: Default

Week 1: Introduction to Reliability Physics

Week 2: Spatial Randomness and Nature of Defects

Homework

Week 3: Interface Reliability of Semiconductor Devices: NBTI Degradation

Week 4: Interface Reliability of Semiconductor Devices (Continued)

Week 5: Interface Reliability of Semiconductor Devices: Hot Carrier Degradation

Week 5: Supplementary Information

Homework

Week 6: Hot Carrier Degradation and Theory and Practice of interface Characterization Techniques

Homework

Week 6: Supplementary Information

Week 7: Theory and Practice of interface Characterization Techniques

Week 8: Time-Dependent Dielectric Breakdown

Week 8: Supplementary Information

Homework

Week 9: Time-Dependent Dielectric Breakdown

Week 10: Breakdown in Thick Dielectrics

Week 11: Radiation Damage in Semiconductor Devices

Week 12: Statistics of Reliability

Week 13: Statistics of Reliability (continued)