1. XPS Thickness Solver

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   total: updated 23 May 2013
   Users:	53
   Jobs:	420
   Avg. exec. time:	1 secs

   Reviews & Citations

   Google/IEEE
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   18 Dec 2011 | Tools | Contributor(s): Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin

   Helps the user to determine the thickness of an overlayer material from XPS experiment data.

2. BME 695L Special Lecture 2: X-ray Photoelectron Spectroscopy (XPS) in Biologically-Relevant Applications

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   Usage Stats

   total: updated 03 May 2013
   Users:	64

   Reviews & Citations

   Google/IEEE
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   01 Nov 2011 | Online Presentations | Contributor(s): Dmitry Zemlyanov

   Guest lecturer: Dmitry Zemlyanov

3. ECET 499N Lecture 9: XPS: X-ray Photoelectron Spectroscopy & ESCA: Electron Spectrometer for Chemical Analysis

   PLG_GROUPS_RESOURCES_THIS_HAS 5.3 Ranking

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   Usage Stats

   total: updated 03 May 2013
   Users:	111

   Reviews & Citations

   Google/IEEE
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   04 Mar 2010 | Online Presentations | Contributor(s): Dmitry Zemlyanov

   Guest Lecturer: Dmitry Zemlyanov

4. Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG

   PLG_GROUPS_RESOURCES_THIS_HAS 5.9 Ranking

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   Usage Stats

   total: updated 03 May 2013
   Users:	277

   Reviews & Citations

   Google/IEEE
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   30 Jan 2010 | Online Presentations | Contributor(s): Dmitry Zemlyanov

   In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to …

5. X-ray Photoelectron Spectroscopy (XPS) Tour

   PLG_GROUPS_RESOURCES_THIS_HAS 7.5 Ranking

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   Usage Stats

   total: updated 03 May 2013
   Users:	1999

   Reviews & Citations

   Google/IEEE
   Avg. Review:	4.0 out of 5 stars
   Citations:

   24 Jan 2008 | Online Presentations | Contributor(s): Dmitry Zemlyanov

   A guided tour, given by Dmitry Zemlyanov, of the X-ray Photoelectron Spectroscopy (XPS) lab located in the Birck Nanotechnology Center at Purdue University.

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