XPS Thickness Solver
18 Dec 2011 | Tools | Contributor(s): Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin
Helps the user to determine the thickness of an overlayer material from XPS experiment data.
BME 695L Special Lecture 2: X-ray Photoelectron Spectroscopy (XPS) in Biologically-Relevant Applications
01 Nov 2011 | Online Presentations | Contributor(s): Dmitry Zemlyanov
Guest lecturer: Dmitry Zemlyanov
ECET 499N Lecture 9: XPS: X-ray Photoelectron Spectroscopy & ESCA: Electron Spectrometer for Chemical Analysis
09 Mar 2010 | Online Presentations | Contributor(s): Dmitry Zemlyanov
Guest Lecturer: Dmitry Zemlyanov
Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG
16 Feb 2010 | Online Presentations | Contributor(s): Dmitry Zemlyanov
In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to characterized surfaces, providing critical information on thickness of graphene layers. XPS data will be compared with the Raman data. (2) Covalent Cross-linking Between polythymidine DNA and Single-walled Carbon Nanotubes (SWCNT) will be considered. The interaction of ss-DNA with SWCNT and Highly Ordered Pyrolytic Graphite (HOPG) will be compared. (3) Modification of HOPG surface with mild AC plasma (O2, H2, Ar, H2O) will be discussed.
X-ray Photoelectron Spectroscopy (XPS) Tour
24 Jan 2008 | Online Presentations | Contributor(s): Dmitry Zemlyanov
A guided tour, given by Dmitry Zemlyanov, of the X-ray Photoelectron Spectroscopy (XPS) lab located in the Birck Nanotechnology Center at Purdue University.