Nanotechnology and Surface Science Applications
27 Nov 2018 | Online Presentations | Contributor(s): Dmitry Zemlyanov
Surface Characterization Facility at Birck Nanotechnology Center, BRK 1077
Chemical and Electronic Properties of Solid Surfaces
01 Nov 2018 | Online Presentations | Contributor(s): Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano‐materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...
Characterization of 2D materials at Birck Surface Analysis Facility
28 Sep 2016 | Online Presentations | Contributor(s): Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...
Nanotechnology for Aerospace Research: Surface Science Applications
29 Mar 2016 | Online Presentations | Contributor(s): Dmitry Zemlyanov
Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray...
XPS Thickness Solver
18 Dec 2011 | Tools | Contributor(s): Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin
Helps the user to determine the thickness of an overlayer material from XPS experiment data.
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