[Illinois] Advanced Materials Characterization Workshop 2015
19 Aug 2015 | Workshops | Contributor(s): Ted Limpoco, Scott Speakman, Timothy P. Spila, Rick Haasch, Justin Masone, Kathy Walsh, Matthew Bresin
AMC 2015 provided a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications. Lectures covered basic and advanced topics geared towards both novice and experienced scientists.Sessions...
[Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 2
18 Aug 2015 | Online Presentations | Contributor(s): Rick Haasch
[Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 1
[Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 3: X-ray Electron Spectroscopy / Auger Electron Spectroscopy
05 Jul 2012 | Online Presentations | Contributor(s): Rick Haasch
This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will cover the following techniques:Atomic force microscopy (AFM)X-ray diffraction, reflectivity and...
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