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ECE 695A Lecture 22: Voltage Dependence of Thin Dielectric Breakdown

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Researchers should cite this work as follows:

  • Muhammad A. Alam (2013), "ECE 695A Lecture 22: Voltage Dependence of Thin Dielectric Breakdown," https://nanohub.org/resources/17028.

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EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. Dielectric Breakdown
  3. dielectrics
  4. nanoelectronics
  5. reliability

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