Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

28 Mar 2012 | Courses | Contributor(s): Souvik Mahapatra

This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has …

http://nanohub.org/resources/13613

Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)

28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

…

http://nanohub.org/resources/13614

Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)

28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has …

http://nanohub.org/resources/13612

Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3)

28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

This presentation is part 2 on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has …

http://nanohub.org/resources/13611

Verification and Validation in Simulations of Complex Engineered Systems

03 Jan 2012 | Online Presentations | Contributor(s): Robert Moser

Computational simulation is a ubiquitous tool in engineering. Further, the explosion of computational capabilities over the last several decades has resulted in the use of computational models of …

http://nanohub.org/resources/12525

Theory and characterization of random defect formation and its implication in variability of nanoscale transistors

30 Sep 2011 | Publications | Contributor(s): Ahmad Ehteshamul Islam

Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of the …

http://nanohub.org/resources/12182

A Physical Model for Non-Ohmic Shunt Conduction and Metastability in Amorphous Silicon Solar Cells

16 Aug 2011 | Online Presentations | Contributor(s): Sourabh Dongaonkar, Souvik Mahapatra, Karthik Yogendra, Muhammad Alam

In this talk we develop a coherent physics based understanding of the shunt leakage problem in a-Si:H cells, and discuss its implications on cell and module level. Sourabh Dongaonkar is with School …

http://nanohub.org/resources/11841

Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)

11 May 2011 | Online Presentations | Contributor(s): Souvik Mahapatra

This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years …

http://nanohub.org/resources/11249

Lecture 9: Breakdown in Thick Dielectrics

05 Apr 2010 | Online Presentations | Contributor(s): Muhammad Alam

Outline: Breakdown in gas dielectric and Paschen’s law Spatial and temporal dynamics during breakdown Breakdown in bulk oxides: puzzle Theory of pre-existing defects: Thin oxides Theory of …

http://nanohub.org/resources/7177

Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown

10 Mar 2010 | Online Presentations | Contributor(s): Muhammad Alam

http://nanohub.org/resources/7176

Lecture 10: Interface Damage & Negative Bias Temperature Instability

02 Feb 2010 | Online Presentations | Contributor(s): Muhammad Alam

Outline: Background information NBTI interpreted by R-D model The act of measurement and observed quantity NBTI vs. Light-induced Degradation Possibility of Degradation-free Transistors …

http://nanohub.org/resources/7178

Lecture 6: 3D Nets in a 3D World: Bulk Heterostructure Solar Cells

27 Oct 2009 | Online Presentations | Contributor(s): Muhammad Alam

Outline: Introduction: 

definitions
 and
 review
 Reaction
 diffusion
 in 
fractal 
volumes Carrier
 transport
 in 
BH
 solar 
cells All
 phase
 transitions …

http://nanohub.org/resources/7174

Lecture 5: 2D Nets in a 3D World: Basics of Nanobiosensors and Fractal Antennae

27 Oct 2009 | Online Presentations | Contributor(s): Muhammad Alam

Outline: Background:
 A
 different
 type
 of
 transport
 problem
 Example:
 Classical
 biosensors Fractal 
dimension
 and
 cantor
 transform Example:
 fractal …

http://nanohub.org/resources/7173

Lecture 4: Stick Percolation and Nanonet Electronics

26 Oct 2009 | Online Presentations | Contributor(s): Muhammad Alam

Outline: Stick percolation and nanonet transistors Short channel nanonet transistors Long channel nanonet transistors Transistors at high voltages Conclusions

http://nanohub.org/resources/7172

2009 NCN@Purdue Summer School: Electronics from the Bottom Up

22 Sep 2009 | Workshops | Contributor(s): Supriyo Datta, Mark Lundstrom, Muhammad Alam, Joerg Appenzeller

The school will consist of two lectures in the morning on the Nanostructured Electronic Devices: Percolation and Reliability and an afternoon lecture on Graphene Physics and Devices. A hands on …

http://nanohub.org/resources/7113

Lecture 1: Percolation and Reliability of Electronic Devices

17 Sep 2009 | Online Presentations | Contributor(s): Muhammad Alam

Network for Computational Nanotechnology, Intel Foundation

http://nanohub.org/resources/7169

Lecture 2: Threshold, Islands, and Fractals

17 Sep 2009 | Online Presentations | Contributor(s): Muhammad Alam

Network for Computational Nanotechnology, Intel Foundation

http://nanohub.org/resources/7170

Lecture 3: Electrical Conduction in Percolative Systems

17 Sep 2009 | Online Presentations | Contributor(s): Muhammad Alam

Network for Computational Nanotechnology, Intel Foundation

http://nanohub.org/resources/7171

Nanostructured Electronic Devices: Percolation and Reliability

17 Sep 2009 | Courses | Contributor(s): Muhammad A. Alam

In this series of lectures introduces a simple theoretical framework for treating randomness and variability in emerging nanostructured electronic devices for wide ranging applications – all within …

http://nanohub.org/resources/7168