ECE 695A Lecture 27: Correlated TDDB in Off-State HCI

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 27: Correlated TDDB in Off-State HCI," https://nanohub.org/resources/17444.

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EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. nanoelectronics
  3. reliability
  4. TBBD
ECE 695A Lecture 27: Correlated TDDB in Off-State HCI
  • Lecture 27: Correlated TDDB in Off-State HCI 1. Lecture 27: Correlated TDDB in… 0
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  • Copyright 2013 2. Copyright 2013 59.35935935935936
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  • Outline 3. Outline 60.393727060393729
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  • Recall: HCI degradation in non-logic transistors 4. Recall: HCI degradation in non… 118.15148481815149
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  • Classical HCI … only ON state?! 5. Classical HCI … only ON stat… 314.94828161494831
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  • Recall: OFF state HCI is possible, if … 6. Recall: OFF state HCI is possi… 406.67334000667336
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  • Degradation mechanism 7. Degradation mechanism 526.65999332666
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  • Heating of electrons generated by BTBT 8. Heating of electrons generated… 623.85719052385718
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  • Outline 9. Outline 718.05138471805139
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  • Generation & recovery of NOT in Off-state 10. Generation & recovery of NOT i… 732.33233233233238
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  • Correlation of hot hole and NIT 11. Correlation of hot hole and NI… 851.88521855188526
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  • Recall: voltage dependent constant t0 12. Recall: voltage dependent cons… 916.31631631631637
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  • Outline 13. Outline 993.25992659325993
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  • HCI leads to dielectric breakdown! 14. HCI leads to dielectric breakd… 1109.4094094094094
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  • Weibull slopes for NMOS and PMOS 15. Weibull slopes for NMOS and PM… 1256.4230897564232
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  • Number Weibull vs. time Weibull 16. Number Weibull vs. time Weibul… 1536.202869536203
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  • Checking time exponent a (DeNMOS) 17. Checking time exponent a (DeNM… 1740.9409409409411
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  • Checking power exponent a (DePMOS) 18. Checking power exponent a (DeP… 1980.9142475809144
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  • Hypothesis: Perhaps xo is not the same! 19. Hypothesis: Perhaps xo is not … 2037.4374374374374
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  • Recall: Current ratio technique 20. Recall: Current ratio techniqu… 2225.9259259259261
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  • Locations close to S/D are challenging 21. Locations close to S/D are cha… 2295.3286619953287
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  • Rational for S/D region exclusion 22. Rational for S/D region exclus… 2343.0430430430433
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  • Determination of breakdown spot for a nonuniform potential profile 23. Determination of breakdown spo… 2363.2632632632635
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  • Position determination in non-uniform field 24. Position determination in non-… 2659.95995995996
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  • Correlated percolation and TDDB 25. Correlated percolation and TDD… 2780.714047380714
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  • Conclusions 26. Conclusions 2905.1051051051054
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