Support

Support Options

Submit a Support Ticket

 
You are here: Home › Resources › Online Presentations › BNC Annual Research Symposium: Metrology and Nanomaterials Characterization › About
This resource has a 6.2 Ranking

Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›

Usage Stats
Total: updated 01 Dec, 2011
Users: 476
Reviews & Citations
Google/IEEE
Avg. Review: 0.0 out of 5 stars
Citations: 0

0 review(s) (Review this)

BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

By Ron Reifenberger

Purdue University

View Presentation (SWF)

Category Online Presentations
Abstract This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
Cite this work

Researchers should cite this work as follows:

  • Ron Reifenberger (2007), "BNC Annual Research Symposium: Metrology and Nanomaterials Characterization," http://nanohub.org/resources/2635.

    BibTex | EndNote

Time 03:00 PM, April 02, 2007
Location Burton Morgan Building, Room 121
Tags
  1. atomic force microscopy
  2. electron microscopy
  3. experiments
  4. material science
  5. nanotribology
  6. scanning probe microscopy
  7. X-Ray Photoelectron Spectroscopy

Get Help

Get Involved

Legal

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies.