Seeing Nano II: Using Atomic Force Microscopy (AFM) to see Nano-size Objects

By Samantha Andrews; NNCI Nano1

1. National Nanotechnology Coordinated Infrastructure, Georgia Institute of Technology, Atlanta, GA

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Abstract

Students will explore the storage capacities of CDs, DVDs, and Blu-ray discs using and Atomic Force Microscope (AFM). The AFM allows us to image objects that are extremely small in size, often on the nanoscale (10-9m). Students will access an AFM via Remotely Accessible Instruments for Nanotechnology (RAIN). RAIN is a free service to educators that allows students to access and control microscopes (http://nano4me.org/remoteaccess). Students control the tools over the Internet in real-time and with the assistance of an experienced engineer at the microscope advising over video conferencing software.

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Credits

Samantha Andrews

Sponsored by

National Nanotechnology Infrastructure Network NSF ECCS 0335765 and Southeastern Nanotechology Infrasstrcture Corridor NSF ECCS 1542174

Cite this work

Researchers should cite this work as follows:

  • Samantha Andrews, NNCI Nano (2020), "Seeing Nano II: Using Atomic Force Microscopy (AFM) to see Nano-size Objects," https://nanohub.org/resources/31903.

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Submitter

Nancy Healy

Georgia Insitute of Technology, Atlanta, GA

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