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ME 597 Lecture 16: Dynamic Approach Curves in AM-AFM (VEDA Demo)
24 Jan 2011 | Online Presentations | Contributor(s): John Melcher
Guest lecturer: John Melcher. VEDA demonstration.
http://nanohub.org/resources/9960
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ME 597 Lecture 20: Scanning Controls (VEDA Demo)
13 Jan 2011 | Online Presentations | Contributor(s): Daniel Kiracofe
Guest lecturer: Daniel Kiracofe. VEDA demonstration.
http://nanohub.org/resources/10060
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ME 597 Homework 4: AM-AFM Scans and Basics of FM-AFM
29 Dec 2010 | Teaching Materials | Contributor(s): Ron Reifenberger
Problems: Setting the feedback parameters in AM-AFM scanning Factors Affecting Contrast in dAFM Topographic and Phase Images FM-AFM A dAFM “pocket guide”
http://nanohub.org/resources/10241
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ME 597 Homework 3:
29 Dec 2010 | Teaching Materials | Contributor(s): Arvind Raman
Problems: Steady state vibration response far from sample Attractive and repulsive regimes of oscillation Practical issues Theory
http://nanohub.org/resources/10239
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ME 597 Lecture 17: Cantilever Eigenmodes, Equivalent Point Mass Oscillator, Analytical Approaches
29 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman
http://nanohub.org/resources/9961
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ME 597 Lecture 25: AFM in Liquids I
20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman
http://nanohub.org/resources/10149
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ME 597 Lecture 26: AFM in Liquids II
20 Dec 2010 | Online Presentations | Contributor(s): Arvind Raman
http://nanohub.org/resources/10150
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ME 597 Lecture 24: Using AFM to Measure Electrostatic Forces
07 Dec 2010 | Online Presentations | Contributor(s): Ron Reifenberger
http://nanohub.org/resources/10064
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ME 597 Lecture 18b: Analytical Approaches - Peak Interaction Forces
17 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman
Peak Force During Tapping - not directly observable.
http://nanohub.org/resources/10013
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ME 597 Lecture 18a: Analytical Approaches
17 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman
http://nanohub.org/resources/9962
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ME 597 Lecture 19: VEDA - Scanning Controls
11 Nov 2010 | Online Presentations | Contributor(s): Arvind Raman
http://nanohub.org/resources/9993
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ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning
20 Oct 2010 | Online Presentations | Contributor(s): Arvind Raman
The raw recording for this lecture is all that is available.
http://nanohub.org/resources/7983
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ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)
01 Sep 2010 | Courses | Contributor(s): Ron Reifenberger, Arvind Raman
Fall 2010 A course for students interested in learning the fundamentals underlying Atomic Force Microscopy. There is really no required textbook for the course. A lot of the material is covered …
http://nanohub.org/resources/9598
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ME 597 Lecture 20: Imaging Artifacts in AM-AFM
27 Jan 2010 | Online Presentations | Contributor(s): Ron Reifenberger
Topics: Probe Tip Artifacts Instrumental Artifacts Large Force Artifacts Image Processing Artifacts Intrinsic Limitations Tip Cleaning Reading: Paul West, Natalia Starostina, AFM Image …
http://nanohub.org/resources/7985
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ME 597 Lecture 16: Analytical Descriptions of AM-AFM, Theory of Phase Contrast
01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman
http://nanohub.org/resources/7715
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ME 597 Lecture 13: Point Mass Models, Modeling AM-AFM
01 Nov 2009 | Online Presentations | Contributor(s): Arvind Raman
http://nanohub.org/resources/7708
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ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)
03 Sep 2009 | Courses | Contributor(s): Ron Reifenberger, Arvind Raman
A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.
http://nanohub.org/resources/7320
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Introduction to VEDA: Virtual Environment for Dynamic AFM
26 Sep 2007 | Learning Modules | Contributor(s): Arvind Raman
This learning module describes the motivation, theory, and features of VEDA- a Virtual Environment for Dynamic Atomic Force Microscopy for the accurate simulation of dynamic AFM on organic and …
http://nanohub.org/resources/2754
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SPMW The Nanomechanics of compositional mapping in amplitude modulation AFM
05 Jan 2007 | Online Presentations | Contributor(s): Ricardo Garcia
Amplitude modulation atomic force microscopy (AM-AFM) has been very successful for imaging with high spatial resolution inorganic as well as soft materials such as polymers, living cells and single …
http://nanohub.org/resources/2176