ME 597 Lecture 20: Imaging Artifacts in AM-AFM

By Ron Reifenberger

Purdue University

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Abstract

Topics:
  • Probe Tip Artifacts
  • Instrumental Artifacts
  • Large Force Artifacts
  • Image Processing Artifacts
  • Intrinsic Limitations
  • Tip Cleaning

References

Reading:
Paul West, Natalia Starostina, AFM Image Artifacts, http://www.lot-oriel.com/site/site_down/pn_artifacts_deen.pdf

Cite this work

Researchers should cite this work as follows:

  • Ron Reifenberger (2010), "ME 597 Lecture 20: Imaging Artifacts in AM-AFM," https://nanohub.org/resources/7985.

    BibTex | EndNote

Time

Location

Armstrong B71, Purdue University, West Lafayette

Tags

  1. Amplitude Modulation AFM
  2. atomic force microscopy (AFM)
  3. course lecture
  4. experiments
  5. Imaging
  6. materials science