Fall 2010

A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

There is really no required textbook for the course. A lot of the material is covered in individual lectures with a selection of key review and historical articles.

Here are some books that we recommend:

• C. Julian Chen, Introduction to Scanning Tunneling Microscopy, 2nd Edition (Oxford University Press, Oxford) 2008.
• J. Israelachvili, Intermolecular and surface forces, 2nd Edition, (Elsevier), 1991.
• E. Meyer, H. J. Hug, R. Bennewitz, Scanning Probe Microscopy – the lab on a tip, (Springer-Verlag) 2003.
• D. Sarid, Scanning Force Microscopy: with applications to electric, magnetic and atomic forces, Oxford Series in Optical and Imaging Sciences, (Oxford University Press, Oxford) 1994.
• V. J. Morris, A. P. Gunnig, A. R. Kirby, Atomic Force Microscopy for Biologists, (World Scientific) 1999.

Individual lectures will reference specific journal articles

Researchers should cite this work as follows:

• Ron Reifenberger; Arvind Raman (2010), "ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)," http://nanohub.org/resources/9598.

1. Amplitude Modulation AFM 1
2. atomic force microscopy 1
3. dynamic AFM 1
4. experiments 1
5. Frequency Modulation AFM 1
6. Imaging 1
7. iTunes U 1
8. material science 1
9. scanning tunneling microscopy 1