Tags: atomic force microscopy (AFM)

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

All Categories (1-20 of 181)

  1. 3 min Research Talk: AFM And EBSD Cross-Comparison Analysis Tool

    31 Jan 2019 | | Contributor(s):: Andrew Martin Krawec

    This talk describes an approach to analyzing the crystal structure using data collected from AFM and EBSD scans to build an accurate image of the crystal structure and orientation in the ceramic

  2. AFM imaging of bare silicon surface to measure its rms roughness

    Q&A|Open | Responses: 1

    Dear Friends,

    my question is related to AFM imaging of silicon surface. after doing phase (AC mode) imaging of silicon surface. i found the roughness of bare silicon surface is ~ 50 nm....

    https://nanohub.org/answers/question/242

  3. Aaron Jay Hoover

    https://nanohub.org/members/94669

  4. Addressing Molecular Dynamics Time-scale Issues to Study Atomic-scale Friction

    12 Oct 2010 | | Contributor(s):: Ashlie Martini

    This presentation will include an introduction to several accelerated molecular dynamics methods. However, particular focus will be given to parallel replica (ParRep) dynamics in which atomistic simulations are run parallel in time to extend their total duration. The ParRep method is based on the...

  5. Advanced Scanning Probe Microscopy I

    01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation

  6. Advanced Scanning Probe Microscopy II

    01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlinePart 1: Can be viewed hereOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: This LectureCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation

  7. Advances in Ambient and Liquid AFM - Nanoscale Structure and Dynamics

    08 Dec 2017 | | Contributor(s):: Roger Proksch

    In this talk, we will explore some recent results in observations of structure and dynamics in a variety of systems ranging from polymer dynamics in ambient conditions, 3D atomic resolution mapping of the structure of the solid-liquid interface, defect dynamics in crystal lattice and biologically...

  8. AFM And EBSD Cross-Comparison Analysis Tool

    14 Aug 2018 | | Contributor(s):: Andrew Martin Krawec, John Blendell, Matthew John Michie

    Ceramic and semiconductor research is limited in its ability to create holistic representations of data in concise, easily-accessible file formats or visual data representations. These materials are used in everyday electronics, and optimizing their electrical and physical properties is...

  9. AFM Metrology of Cellulose Nanocrystals

    03 May 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner

    This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.

  10. AFM Sample Preparation in Biology

    03 May 2011 | | Contributor(s):: Irene Revenko

    All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a substrate, immobilizing the sample, choosing the proper cantilever, as well as tips and tricks optimize...

  11. Alok Ranjan

    https://nanohub.org/members/71877

  12. Amin Vakhshouri

    I am a solid-state physicist, specialized in design, fabrication and electronic characterization of advanced materials using transport and scanning probe microscopy techniques. My research involved...

    https://nanohub.org/members/73806

  13. Ashish Chanana

    https://nanohub.org/members/85959

  14. Asylum Research Atomic Force Microscopy (AFM) Workshop

    03 May 2011 |

    This workshop includes lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials.

  15. Atomic Force Microscopy

    01 Dec 2005 | | Contributor(s):: Arvind Raman

    Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the...

  16. Atomic Force Microscopy: Applications for Life Science Research

    21 Mar 2011 | | Contributor(s):: Irene Revenko

    This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical characteristics you should understand when using an AFM such as noise level, limitations of the...

  17. Base Motion Calculations

    17 Jun 2011 | | Contributor(s):: Daniel Kiracofe

    Automates the calculations in the paper by Kiracofe and Raman, Nanotechnology, 2011

  18. BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)

    02 Dec 2011 | | Contributor(s):: Helen McNally

    Guest lecturer: Helen McNally

  19. BME 695N Lecture 9: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)

    30 Sep 2007 | | Contributor(s):: Helen McNally

    What Helen McNally as guest lecturer.

  20. BNC Annual Research Review: Recent advances in dynamic Atomic Force Microscopy Research at Birck

    02 Dec 2009 | | Contributor(s):: Arvind Raman