Resources (1-20 of 64)

1. Application of Dynamic Light Scattering in the Physicochemical Characterization of Natural and Engineered Nanoparticles

   Online Presentations | 20 Apr 2012 | Contributor(s):: Trisha Eustaquio

   This presentation will highlight the use of dynamic light scattering (DLS), which measures the hydrodynamic size of nanoparticles in suspension, in characterizing specific examples of engineered and natural nanoparticles. In terms of engineered nanoparticles, the role of nanoparticle size in...

2. Basic Characterization Techniques

   Online Presentations | 24 Aug 2018 | Contributor(s):: Sebastien Maeder, NACK Network

   OutlineIntroductionOptical MicroscopesProfilometryEllipsometryReflective SpectroscopyContact Angle

3. Birck Nanomaterials Characterization Workshop

   Workshops | 11 Nov 2018 | Contributor(s):: Neil R Dilley

   The aim of the workshop is to review the measurement techniques for both newcomers and existing users, see the instruments in action, and discuss cutting edge developments in both instrumentation and research.

4. Cadmium Selenide Synthesis, Characterization and Modeling

   Teaching Materials | 22 Oct 2021 | Contributor(s):: Shelby Hatch, Evan R. Trivedi, Baudilio Tejerina, George C. Schatz

   This is a combined experiment/computational lab in which cadmium selenide quantum dot nanoparticles are synthesized, their spectra are studied, and the results are modeling using the CNDO/INDO semiempirical electronic structure code. Synthesis and Size Dependent Properties of CdSe Quantum...

5. Carbon Nanotubes Interconnect Analyzer (CNIA)

   Tools | 14 Mar 2007 | Contributor(s):: Sansiri Tanachutiwat, Wei Wang

   Analyze performances of carbon nanotube bundle interconnects

6. Characterization - Scanning Electron Microscopy

   Online Presentations | 30 Sep 2021 | Contributor(s):: Atilla Ozgur Cakmak, NACK Network

7. Characterization of 2D materials at Birck Surface Analysis Facility

   Online Presentations | 28 Sep 2016 | Contributor(s):: Dmitry Zemlyanov

   Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...

8. Characterizing Electrolytic Materials

   Teaching Materials | 31 Mar 2021 | Contributor(s):: Steven Kandel, NNCI Nano

    The lab is designed to help students understand that the resistance of an object depends on length, cross-sectional area, and the type of material. Students measure the current through objects to see that different materials resist current in different amounts. Students will find that,...

9. Colloidal Gold Nanoparticle Synthesis and Characterization

   Teaching Materials | 12 Dec 2017 | Contributor(s):: Jared Ashcroft, NACK Network

   Colloidal Gold Nanoparticles are synthesized and characterized using a remote Scanning Electron Microscope provided by the Remotely Accessible Instruments in Nanotechnology (RAIN) Network.

10. Critical Measurements to Enable the Use of Polymers in Membranes, Composites, and Impact Mitigation

    Online Presentations | 05 Mar 2019 | Contributor(s):: Christopher L. Soles

    In this presentation I will present an overview of my research groups activities in these three areas, highlighting the importance of polymer structure and dynamics in establishing the functional properties of the polymers that enable the technology.  For the sake of this presentation, I...

11. Dye-Sensitized Nanocrystalline Solar Cell

    Teaching Materials | 12 Dec 2017 | Contributor(s):: Jared Ashcroft, NACK Network

    A dye-sensitized nano-crystalline solar cell is produced and characterized using a remote Scanning Electron Microscope provided by the Remotely Accessible Instruments in Nanotechnology (RAIN) Network.

12. Electrodeposition of Nickel Nanowires

    Teaching Materials | 05 Dec 2017 | Contributor(s):: NACK Network

    Nickel nanowires were put through electrodeposition processes and analyzed using a remote Scanning Electron Microscope provided by the Remotely Accessible Instruments in Nanotechnology (RAIN) Network.

13. Electronic Characterization of Materials Using Conductive AFM

    Online Presentations | 03 May 2011 | Contributor(s):: Amir Moshar

14. Fabrication and Characterization of Nanostructures Using AFM

    Online Presentations | 26 Feb 2022 | Contributor(s):: Wesley C. Sanders, Glen Johnson, NACK Network

    The atomic force microscope (AFM) is a versatile characterization tool that allows users to acquire high-resolution images of nanoscale surface features. In addition to probing nanoscale surface topography, AFMs can be used to print nanoscale structures using additive and subtractive lithographic...

15. Fundamentals of Metrology and Characterization for Nanotechnology

    Online Presentations | 13 Mar 2019 | Contributor(s):: Diane Hickey-Davis, NACK Network

    Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it

16. Graphene Interconnect

    Tools | 17 Mar 2008 | Contributor(s):: Sansiri Tanachutiwat, Wei Wang, Nicholas Anthony Connelly

    Estimate performances of graphene interconnects

17. High Impedance Hall Measurements and the Fully Guarded Insert

    Online Presentations | 16 Apr 2024 | Contributor(s):: Jeffrey Lindemuth

18. Introduction to X-ray Microscopy (XRM): Technology and Applications for Lab-based Non-destructive, High-resolution 3D Imaging and Analysis

    Online Presentations | 22 Jul 2019 | Contributor(s):: John Kelley

    This talk will cover an overview of XRM technology as well as prominent examples and applications.

19. Lab Exercise: Ellipsometry

    Teaching Materials | 18 Jan 2017 | Contributor(s):: NACK Network

    The objective of this lab is to evaluate the ellipsometer. Multiple ellipsometers will be presented and compared. The procedural operation and working mechanisms of the ellipsometer will both be discussed.

20. Learn How to Optimize Low-Level Measurements using Lake Shore Cryogenic Probe Stations and Quantum Design PPMS®

    Workshops | 16 Apr 2024 | Contributor(s):: Neil R Dilley (organizer), Emilio Codecido, Jeffrey Lindemuth, David Daughton

    A wide range of topics are covered, including: „Basic principles of lock-in amplifiers and filters„Appropriate wiring and source-measureinstrumentation for your samples„Hall and Quantum Hall effect measurements„Wafer-level DC, AC, and RF measurementsThe workshop includes a mix of lectures and...