Presentation Materials (1-3 of 3)

1. Too hot to handle? The emerging challenge of reliability/variability in self-heated FintFET, ETSOI, and GAA-FET

   Presentation Materials | 11 Jan 2016 | Contributor(s):: Muhammad A. Alam, Sang Hoon Shin, Muhammad Abdul Wahab, Jiangjiang Gu, Jingyun Zhang, Peide "Peter" Ye

   This presentation is part of the 8th IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2015. It is difficult to control the geometry, doping, and thicknesses of small transistors. Moreover, nanoscale transistors degrade due to NBTI and HCI at vastly different...

2. Modeling Self-Heating Effects in SOI Devices and GaN HEMTs

   Presentation Materials | 12 Jun 2013 | Contributor(s):: Dragica Vasileska

   The role of self-heating effects is investigated in SOI devices and GaN HEMTs.

3. Research Within Vasileska Group

   Presentation Materials | 29 Jun 2010 | Contributor(s):: Dragica Vasileska

   This presentation outlines recent progress in reseach within Vasileska group in the area of random telegraph noise and thermal modeling, and modeling of GaN HEMTs.