Papers (1-5 of 5)

1. Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films

   Papers | 02 Feb 2012 | Contributor(s):: Brian Demczyk

   In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.

2. Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films

   Papers | 07 Oct 2011 | Contributor(s):: Brian Demczyk, V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner

   We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy onhydrogen-terminated @100# silicon substrates.

3. Origin of the orientation ratio in sputtered longitudinal media

   Papers | 07 Oct 2011 | Contributor(s):: Brian Demczyk, J. N. Zhou, G. Choe, E. Stach, E. C. Nelson, U. Dahmen

   The surface morphology, thin film microstructure, and crystallography of sputtered longitudinalmedia were examined by atomic force and transmission electron microscopy.

4. Magnetic properties of magnetron sputtered Co-Cr thin films

   Papers | 07 Oct 2011 | Contributor(s):: Brian Demczyk, J. O. Artman

   The magnetic properties 01 magnetron sputtered CO-22 at.% Cr films of various thickness deposited on glass have been examined, with particular attentionto the various contributions to the film anisotropy

5. Oxidation Behavior of CoCr Thin Films

   Papers | 07 Oct 2011 | Contributor(s):: Brian Demczyk

   In this work, elemental redistribution of annealed CoCr thin films has been investigated by X-ray photoelectron spectroscopy.