Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG
Online Presentations | 16 Feb 2010 | Contributor(s):: Dmitry Zemlyanov
In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to...