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Biological 3D Structures by Cryo-EM: Challenges in Computations and Instruments
23 Oct 2019 | | Contributor(s):: Wen Jiang
Single particle cryo-EM is revolutionizing structural biology. Many structures of viruses and protein complexes have been determined to 2-4 Å resolutions. While stable structures that can be expressed/purified in large quantities can be solved routinely, the dynamic compositions and...
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BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems
22 Nov 2011 | | Contributor(s):: James Leary
See references below for related reading.14.1 Introduction to integrated designs14.1.1 “Total design” but there is some order in the design process14.1.2 A brief outline of the total design...
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Charged-Particle Interaction Analysis
07 Jan 2022 | | Contributor(s):: Atilla Ozgur Cakmak, NACK Network
Scanning Electron Microscopy (SEM) has traditionally been the most frequently used micro-/nano- characterization technique to overcome the optical losses coming from lenses. In this talk we are going to begin by discussing the fundamental blocks of an SEM starting from the electron beam emission....
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ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | | Contributor(s):: Eric Stach
Guest lecture: Eric A. Stach
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Electron Microscopy
24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlineScanning Electron MicroscopyField Emission Scanning Electron MicroscopyTransmission Electron MicroscopyEnergy Dispersive Spectroscopy
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Fundamentals of Metrology and Characterization for Nanotechnology
13 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network
Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it
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Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | | Contributor(s):: Klaus Schulten
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Introduction of Transmission Electron Microscope
11 Oct 2022 | | Contributor(s):: Nan Yao, NACK Network
For Nanotechnology, Nanobiotechnology, and Nanomaterials characterization and quality control Transmission Electron Microscopy (TEM) is still used for its ability to produce images of relevant features from angstroms to microns. In this course we will discuss the state of the art in TEM...
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MSE 582 Lecture 10: Diffraction Contrast Imaging
13 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources
28 Jan 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 3: Lenses, Apertures and Resolution
20 Sep 2017 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 4: The Instrument, Part 1
28 Jan 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 4: The Instrument, Part 2
28 Jan 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 6: Vacuum Science in EM
28 Jan 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 7: Sample Preperation
11 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 640 Lecture 11: Diffraction contrast imaging
29 May 2008 | | Contributor(s):: Eric Stach
Thickness fringes, Bend contours, Planar faults
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MSE 640 Lecture 12: Diffraction contrast imaging, Part 1
29 May 2008 | | Contributor(s):: Eric Stach
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
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MSE 640 Lecture 12: Diffraction contrast imaging, Part 2
29 May 2008 | | Contributor(s):: Eric Stach
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
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MSE 640 Lecture 13: Diffraction contrast imaging
29 May 2008 | | Contributor(s):: Eric Stach
Weak beam dark field imaging, Simulation of diffraction contrast
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MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM
29 May 2008 | | Contributor(s):: Eric Stach