NACK Unit 6: Basic Characterization Techniques

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Center for Nanotechnology Education and Utilization, Pennsylvania State University, State College, PA

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Lecture Number/Topic	Online Lecture	Video	Lecture Notes	Supplemental Material	Suggested Exercises
Touching, Seeing, Chemically Detecting, and Hearing at our Size Scale	View HTML	View		Touching, Seeing, Chemically Detecting, and Hearing at our Size Scale Touching, Seeing, Chemically Detecting, and Hearing at our Size Scale
The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale	View HTML	View		The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale
Basic Characterization Techniques	View HTML	View		Basic Characterization Techniques Basic Characterization Techniques
Introduction to Scanning Electron Microscopy (SEM)	View HTML	View		Introduction to Scanning Electron Microscopy (SEM) Introduction to Scanning Electron Microscopy (SEM)
Electron Microscopy	View HTML	View		Electron Microscopy Electron Microscopy
Introduction to Field Emission Scanning Electron Microscopy (FESEM)		View
Focused Ion Beam (FIB): “Seeing” and “Processing” at the Nano-Scale	View HTML	View		Focused Ion Beam (FIB): “Seeing” and “Processing” at the Nano-Scale Focused Ion Beam (FIB): “Seeing” and “Processing” at the Nano-Scale
Operational Overview of the Veeco Innova Scanning Probe Microscope (SPM)		View
Advanced Scanning Probe Microscopy I	View HTML	View		Advanced Scanning Probe Microscopy I
Advanced Scanning Probe Microscopy II	View HTML	View		Advanced Scanning Probe Microscopy II
Sample Preparation for Powder X-ray Diffraction		View
X-Ray Photoelectron Spectroscopy (XPS)	View HTML	View		X-Ray Photoelectron Spectroscopy (XPS) X-Ray Photoelectron Spectroscopy (XPS)
Secondary Ion Mass Spectrometry (SIMS)	View HTML	View		Secondary Ion Mass Spectrometry (SIMS) Secondary Ion Mass Spectrometry (SIMS)
Confocal Microscopy	View HTML	View		Confocal Microscopy Confocal Microscopy
Fundamentals of Metrology and Characterization for Nanotechnology	View HTML	View		Fundamentals of Metrology and Characterization for Nanotechnology