Lecture 10: Interface Damage & Negative Bias Temperature Instability
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Abstract
Outline:
- Background information
- NBTI interpreted by R-D model
- The act of measurement and observed quantity
- NBTI vs. Light-induced Degradation
- Possibility of Degradation-free Transistors
- Conclusions
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Beering Hall, Room 2280, Purdue University, West Lafayette, IN