Tags: atomic force microscopy (AFM)

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Resources (121-140 of 141)

  1. SPMW Scanning Probe Acceleration Microscopy: Towards Real Time Reconstruction of Tip-Sample Forces in Tapping Mode AFM

    05 Jan 2007 | | Contributor(s):: Tomasz Kowalewski

    Tapping mode atomic force microscopy (TMAFM) in fluids has become an increasingly important technique, especially in studying biological samples under near physiological conditions. However, until recently the physics of tapping mode operation under fluids has not been well understood. The first...

  2. SPMW Single molecule recognition atomic force microscopy

    05 Jan 2007 | | Contributor(s):: Peter Hinterdorfer

    In molecular recognition force microscopy (MRFM), ligands are covalently attached to atomic force microscopy tips for the molecular recognition of their cognitive receptors on probe surfaces. A ligand-containing tip is approached towards the receptors on the probe surface, which possibly leads to...

  3. BME 695N Lecture 9: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)

    30 Sep 2007 | | Contributor(s):: Helen McNally

    What Helen McNally as guest lecturer.

  4. Introduction to VEDA: Virtual Environment for Dynamic AFM

    26 Sep 2007 | | Contributor(s):: Arvind Raman

    This resource has become outdated and has been retired by agreement with the author. Please see the VEDA tool page and supporting documents for current information regarding the VEDA Tool. This learning module describes the motivation, theory, and features of VEDA- a Virtual Environment for...

  5. Oligodeoxyribonucleotide Association with Single-Walled Carbon Nanotubes

    02 Aug 2007 | | Contributor(s):: Jennifer McDonald

    Commercially available single-walled carbon nanotubes (SWCNTs) tend to aggregate as ropes and bundles during production making them of little use in many scientific and industrial applications. An effective technique for dispersing and solubilizing SWCNTs is required to fully utilize their unique...

  6. Re-engineering a Healthy Eye Tissue to Restore Damaged Eyesight

    02 Aug 2007 | | Contributor(s):: Margarita Shalaev

    Age-related macular degeneration (AMD) is an eye disease that is the leading cause of blindness in the USA and Western Europe. It affects over one million people in the United States alone. One of the symptoms of AMD is a diseased Bruch’s membrane, which is an important layer in the eye. Our...

  7. SPMW A fresh look to amplitude-modulation AFM: Force minimization, interaction measurement, and the quest for high resolution

    05 Jan 2007 | | Contributor(s):: Udo D. Schwarz

    Frequency modulation atomic force microscopy (FM-AFM) has been able to deliver high-resolution atomic-scale images in ultrahigh vacuum for over one decade. In addition, there have been recent reports where atomic resolution has been achieved in air and liquids using FM-AFM [1]. Achieving...

  8. SPMW AFM at Video Rate and Beyond

    16 May 2007 | | Contributor(s):: Mervyn Miles

    The particular advantages that atomic force microscopy (AFM) has over other types of microscopy are well-known, but it has the one major disadvantage of low imaging rates in conventional instruments in which each image requires typically a minute or more to collect. This has two major detrimental...

  9. SPMW The Nanomechanics of compositional mapping in amplitude modulation AFM

    05 Jan 2007 | | Contributor(s):: Ricardo Garcia

    Amplitude modulation atomic force microscopy (AM-AFM) has been very successful for imaging with high spatial resolution inorganic as well as soft materials such as polymers, living cells and single biomolecules in their natural environment [1]. The ability of AM-AFM to separate topography from...

  10. BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

    10 May 2007 | | Contributor(s):: Ron Reifenberger

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.

  11. SPMW FIRAT: A fast and sensitive probe structure for SPM

    05 Jan 2007 | | Contributor(s):: F. Levent Degertekin

    A new SPM probe, called the force sensing integrated readout and active tip (FIRAT), is described and initial experimental results obtained on commercial AFM systems are presented. FIRAT combines a micromachined integrated electrostatic actuator to move the tip and an integrated optical...

  12. VEDA: Dynamic Approach Curves

    15 Mar 2007 | | Contributor(s):: John Melcher, Shuiqing Hu, Steven Douglas Johnson, Daniel Kiracofe, Arvind Raman

    This tool is being replaced by VEDA 2.0. Use that tool instead.

  13. Toward Improving the Precision of Nanoscale Force-Displacement Measurements

    13 Mar 2007 | | Contributor(s):: Jason Clark

    Nanotechnology has great potential for being used to create better medicines, materials, and sensors. With increasing interest in nanotechnology to improve the quality of our lives, there has been an increasing use of nanoscience tools to measure force and displacement to understand nanoscale...

  14. Frontiers in Scanning Probe Microscopy

    30 Nov 2006 |

    From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world.The three day workshop featured thematically arranged invited talks. The workshop themes are...

  15. SPMW Interplay between theory and experiment in AFM nanomechanical studies of polymers

    30 Nov 2006 | | Contributor(s):: Sergei Magonov, Sergey Belikov

    High-resolution imaging of surfaces and compositional mapping of heterogeneous materials are the main functions of atomic force microscopy (AFM) in studies of polymer materials. Compositional mapping is mostly based on differences of mechanical properties of the sample components yet quantitative...

  16. SPMW Nanotube, nanoneedle and nanomeniscus: mechanical and wetting properties of modified AFM tip apex

    12 Dec 2006 | | Contributor(s):: J. P. Aimé

    Among AFM microscopes, Dynamic force microscopes (DFM) are very sensitive to variation of minute forces involved in the interaction between the tip and the surface. However, despite numerous efforts, imaging and probing mechanical properties of soft materials in air and water at the nm scale are...

  17. SPMW Nanomechanics: from nanotechnology to biology

    12 Dec 2006 | | Contributor(s):: Elisa Riedo

    The development of new materials with size of few nanometers has opened a new field of scientific and technological research. The goal is to develop faster and better communication systems and transports, as well as smarter and smaller nanodevices for biomedical applications. To reach these...

  18. SPMW Nonlinear dynamics in AFM - chaos and parametric resonance

    05 Jan 2007 | | Contributor(s):: Arvind Raman

    The field of nonlinear dynamics deals with mathematical techniques to study the nonlinear equations that serve as models of physical systems. The benefits of using nonlinear dynamics concepts to interpret and predict probe oscillations in dynamic AFM [1] are becoming increasingly clear. Nonlinear...

  19. SPMW Mechanisms of atomic friction studied by friction force microscopy

    12 Dec 2006 | | Contributor(s):: Ernst Meyer

    Force microscopy is a versatile instrument to investigate physical phenomena on surfaces. The first emphasis is on the study of friction on the nanometer-scale, also called nanotribology. It will be shown that atomic-scale stick-slip is relatively well understood, where the dependence on velocity...

  20. Atomic Force Microscopy

    01 Dec 2005 | | Contributor(s):: Arvind Raman

    Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the...