Tags: electron microscopy

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Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

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  1. Matt Schneider

    https://nanohub.org/members/66808

  2. Matthew Glen Robertson

    https://nanohub.org/members/149764

  3. Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns

    30 Jan 2012 | | Contributor(s):: Brian Demczyk, D. E. Laughlin

    This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.

  4. MSE 582 Lecture 10: Diffraction Contrast Imaging

    out of 5 stars 

    13 Feb 2008 | | Contributor(s):: Eric Stach

  5. MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

    out of 5 stars 

    14 Feb 2008 | | Contributor(s):: Eric Stach

  6. MSE 582 Lecture 12: Analytical Electron Microscopy

    out of 5 stars 

    15 Feb 2008 | | Contributor(s):: Eric Stach

  7. MSE 582 Lecture 1: Introduction

    out of 5 stars 

    28 Jan 2008 | | Contributor(s):: Eric Stach

  8. MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources

    out of 5 stars 

    28 Jan 2008 | | Contributor(s):: Eric Stach

  9. MSE 582 Lecture 4: The Instrument, Part 1

    out of 5 stars 

    28 Jan 2008 | | Contributor(s):: Eric Stach

  10. MSE 582 Lecture 5: Electron Detection

    out of 5 stars 

    04 Feb 2008 | | Contributor(s):: Eric Stach

  11. MSE 582 Lecture 6: Vacuum Science in EM

    out of 5 stars 

    28 Jan 2008 | | Contributor(s):: Eric Stach

  12. MSE 582 Lecture 7: Sample Preperation

    out of 5 stars 

    11 Feb 2008 | | Contributor(s):: Eric Stach

  13. MSE 582 Lecture 8: Electron Scattering

    out of 5 stars 

    11 Feb 2008 | | Contributor(s):: Eric Stach

  14. MSE 582 Lecture 9: Diffraction

    out of 5 stars 

    11 Feb 2008 | | Contributor(s):: Eric Stach

  15. MSE 582 Transmission Electron Microscopy Skills

    out of 5 stars 

    28 Jan 2008 | | Contributor(s):: Eric Stach

    Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all students who use the TEM in their research.

  16. MSE 640 Lecture 11: Diffraction contrast imaging

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach

    Thickness fringes, Bend contours, Planar faults

  17. MSE 640 Lecture 12: Diffraction contrast imaging, Part 1

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  18. MSE 640 Lecture 12: Diffraction contrast imaging, Part 2

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  19. MSE 640 Lecture 13: Diffraction contrast imaging

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach

    Weak beam dark field imaging, Simulation of diffraction contrast

  20. MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach