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Too hot to handle? The emerging challenge of reliability/variability in self-heated FintFET, ETSOI, and GAA-FET
11 Jan 2016 | Presentation Materials | Contributor(s): Muhammad A. Alam, Sang Hoon Shin, Muhammad Abdul Wahab, Jiangjiang Gu, Jingyun Zhang, Peide "Peter" Ye
This presentation is part of the 8th IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2015. It is difficult to control the geometry, doping, and thicknesses of small...
Failures in Photovoltaic Modules
21 Apr 2015 | Online Presentations | Contributor(s): Peter Bermel
In this talk, I will discuss some of the major sources of performance degradation for common glass-encapsulated PV modules, including crystalline silicon and thin films. The greatest reliability...
Long term Aging of Autonomous STructures (LAAST) Seminar Series
07 Apr 2015 | Series | Contributor(s): Ali Shakouri
The Long term Aging of Autonomous STructures (LAAST) seminar series focuses on reliability and aging of devices for energy conversion, information processing or sensing.
A Blind Fish in a River with a Waterfall
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31 Jul 2014 | Tools | Contributor(s): Muhammad Alam, Sajia Sadeque
Prototype for a reliability problem defined as Stochastic Process with a Threshold
ECE 695A Lecture 37: Radiation Induced Damage – An overview
20 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Introduction and short history of radiation damage
Radiation damage in various types of components
Sources of radiation
A basic calculation and simulation...
ECE 695A Lecture 37R: Review Questions
Why is SOI more radiation hard compared to bulk devices? What do you feel about radiation hardness of FINFET?
What type of radiation issues could arise for thin-body...
ECE 695A Lecture 34: Scaling Theory of Design of Experiments
18 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Buckingham PI Theorem
An Illustrative Example
Recall the scaling theory of HCI, NBTI, and TDDB
ECE 695A Lecture 34A: Appendix - Variability by Bootstrap Method
ECE 695A Lecture 33: Model Selection/Goodness of Fit
The problem of matching data with theoretical distribution
Parameter extractions: Moments, linear regression, maximum likelihood
Goodness of fit: Residual, Pearson, Cox,...
ECE 695A Lecture 33R: Review Questions
With higher number of model parameters, you can always get a good fit – why should you minimize the number of parameters
Least square method is a subset of maximum...
ECE 695A Lecture 32R: Review Questions
17 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Why do people use Normal, log-normal, Weibull distributions when they do not know the exact physical distribution?
What is the problem of using empirical distributions?...
ECE 695A Lecture 32: Physical vs. Empirical Distribution
Physical Vs. empirical distribution
Properties of classical distribution function
Moment-based fitting of data
ECE 695A Lecture 31R: Review Questions
15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
What is the difference between parametric estimation vs. non-parametric estimation?
What principle did Tacho Brahe’s approach assume?
What is the difference between...
ECE 695A Lecture 31: Collecting and Plotting Data
Origin of data, Field Acceleration vs. Statistical Inference
Preparing data for projection: Hazen formula
Preparing data for projection: Kaplan...
ECE 695A Lecture 31A: Appendix - Bootstrap Method Introduction
ECE 695A Lecture 30R: Review Questions
08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
What is the difference between extrinsic vs. intrinsic breakdown?
Does gas dielectric have extrinsic breakdown? Why or why not?
What does ESD damage and the plasma damage to thin...
ECE 695A Lecture 30: Breakdown in Dielectrics with Defects
Theory of pre-existing defects: Thin oxides
Theory of pre-existing defects: thick oxides
ECE 695A Lecture 29R: Review Questions
Mention a few differences between thick and thin oxide breakdown.
Is breakdown in thick oxides contact dominated? Can I use AHI theory here?
How does the Paschen’s cascade...
ECE 695A Lecture 29A: Appendix - Dimension of a Surface
ECE 695A Lecture 28: Circuit Implications of Dielectric Breakdown
Part 1 - Understanding Post-BD FET behavior
BD position determination
Hard and Soft BD in FETs
Distinguishing leakage and intrinsic FET parameters shifts
Part 2 - Impact of...