Courses (1-4 of 4)

1. ECE 695A Reliability Physics of Nanotransistors

   17 Jan 2013 | | Contributor(s):: Muhammad Alam

   This course will focus on the physics of reliability of small semiconductor devices. In traditional courses on device physics, the students learn how to compute current through a device when a voltage is applied.

2. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

   28 Mar 2012 | | Contributor(s):: Souvik Mahapatra

   This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner SiON...

3. Nanostructured Electronic Devices: Percolation and Reliability

   17 Sep 2009 | | Contributor(s):: Muhammad A. Alam

   In this series of lectures introduces a simple theoretical framework for treating randomness and variability in emerging nanostructured electronic devices for wide ranging applications – all within an unified framework of spatial and temporal percolation. The problems considered involve...

4. Reliability Physics of Nanoscale Transistors

   out of 5 stars 

   27 Nov 2007 | | Contributor(s):: Muhammad A. Alam

   This course is now offered on nanoHUB as ECE 695A Reliability Physics of Nanotransistors.