ECE 695A Lecture 37: Effect of Radiation Induced Charge - Soft Errors

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

Outline:

  • Sources of radiation
  • Basics of charge generation and perturbation of potential
  • Charges and junctions
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 37: Effect of Radiation Induced Charge - Soft Errors ," https://nanohub.org/resources/17709.

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Time

Location

EE 226, Purdue University, West Lafayette, IN

ECE 695A Lecture 37: Effect of Radiation Induced Charge - Soft Errors
  • Lecture 37: Effect of Radiation Induced Charge -- Soft Errors 1. Lecture 37: Effect of Radiatio… 0
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  • Copyright 2013 2. Copyright 2013 98.7987987987988
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  • Outline 3. Outline 119.91991991991992
    00:00/00:00
  • Outline 4. Outline 190.25692359025692
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  • Sources of Radiation 5. Sources of Radiation 642.44244244244248
    00:00/00:00
  • Source 1: Cosmic Ray (above atmosphere) 6. Source 1: Cosmic Ray (above at… 746.94694694694692
    00:00/00:00
  • Sources 2: Solar Wind 7. Sources 2: Solar Wind 1133.9673006339674
    00:00/00:00
  • Asymmetry of Solar Wind 8. Asymmetry of Solar Wind 1271.0043376710044
    00:00/00:00
  • Altitude Dependent Radiation Flux 9. Altitude Dependent Radiation F… 1351.5849182515849
    00:00/00:00
  • Altitude Dependent Radiation Flux 10. Altitude Dependent Radiation F… 1728.9622956289625
    00:00/00:00
  • Radiation Intensity at the Earth Level 11. Radiation Intensity at the Ear… 1952.9863196529864
    00:00/00:00
  • Sources of Radiation 3: Packaging 12. Sources of Radiation 3: Packag… 2241.7083750417087
    00:00/00:00
  • Sources of Radiation: Packaging 13. Sources of Radiation: Packagin… 2368.5685685685685
    00:00/00:00
  • Outline 14. Outline 2420.7207207207207
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  • Outline 15. Outline 2428.2949616282949
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  • Generation of Electron-Hole Pairs 16. Generation of Electron-Hole Pa… 2439.6062729396062
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  • Intrinsic structure: particle strike 17. Intrinsic structure: particle … 2520.286953620287
    00:00/00:00
  • Localized photo generated e-h pairs 18. Localized photo generated e-h … 2581.3146479813149
    00:00/00:00
  • Importance of Electrostatics 19. Importance of Electrostatics 2708.4084084084084
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  • Outline 20. Outline 2836.67000333667
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  • For p-n junction: even with very low lifetime 21. For p-n junction: even with ve… 2838.2048715382048
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  • Photo generated e-h pairs at Junctions 22. Photo generated e-h pairs at J… 2881.6149482816149
    00:00/00:00
  • Electron/hole densities 23. Electron/hole densities 2950.3837170503839
    00:00/00:00
  • Potential before and after radiation 24. Potential before and after rad… 3004.3376710043376
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  • E- field before and after radiation 25. E- field before and after radi… 3028.1281281281281
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  • Critical Charge: Qcrit 26. Critical Charge: Qcrit 3054.8214881548215
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  • Critical charge in devices 27. Critical charge in devices 3071.5048381715051
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  • Critical Charge in circuits 28. Critical Charge in circuits 3128.3283283283286
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  • Conclusions 29. Conclusions 3177.610944277611
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  • References 30. References 3245.4120787454121
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