SCALE From Electronics Testing to Radiation Testing: A Discussion

By Michael Alles1; Steven Bibyk2; Will Ebel3; Andrew L. Sternberg1

1. Electrical and Computer Engineering, Vanderbilt University, Nashville, TN 2. Electrical and Computer Engineering, Ohio State University, Columbus, OH 3. Electrical and Computer Engineering, Saint Louis University, St. Louis, MO

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Abstract

A discussion on teaching electronics testing in the lab.

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SCalable Asymmetric Lifecycle Engagement (SCALE)

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Researchers should cite this work as follows:

  • Michael Alles, Steven Bibyk, Will Ebel, Andrew L. Sternberg (2024), "SCALE From Electronics Testing to Radiation Testing: A Discussion," https://nanohub.org/resources/38757.

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Tags

  1. radiation hardening
  2. radiation testing
  3. SCALE (Scalable Asymmetric Lifecycle Engagement)
  4. SCALE@Vanderbilt
  5. teaching and learning