SCALE Built-in Self-Test Architecture for Characterization of Single Event Effects in a Commercially Available Bulk 90nm Technology

By Spencer Westfall

Indiana University, Bloomington, IN

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Researchers should cite this work as follows:

  • Spencer Westfall (2024), "SCALE Built-in Self-Test Architecture for Characterization of Single Event Effects in a Commercially Available Bulk 90nm Technology," https://nanohub.org/resources/39456.

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