Tags: atomic force microscopy (AFM)

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Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Animations (1-1 of 1)

  1. Butterfly Wing at the Nanoscale

    09 Mar 2022 | | Contributor(s):: NACK Network

    Eliza demonstrates various microscopes and the abilities each offers a user in examining a butterfly wing. Facts about each microscope, and butterflies in general, are offered in an interactive experience designed to engage students of all ages.