Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Butterfly Wing at the Nanoscale
09 Mar 2022 | | Contributor(s):: NACK Network
Eliza demonstrates various microscopes and the abilities each offers a user in examining a butterfly wing. Facts about each microscope, and butterflies in general, are offered in an interactive experience designed to engage students of all ages.
Fabrication and Characterization of Nanostructures Using AFM
26 Feb 2022 | | Contributor(s):: Wesley C. Sanders, Glen Johnson, NACK Network
The atomic force microscope (AFM) is a versatile characterization tool that allows users to acquire high-resolution images of nanoscale surface features. In addition to probing nanoscale surface topography, AFMs can be used to print nanoscale structures using additive and subtractive lithographic...
Characterization - Atomic Force Microscopy
12 Jan 2022 | | Contributor(s):: Wesley C. Sanders, NACK Network
Symposium on Nanomaterials for Energy: Atomic Force Microscopy for Energy Applications - A Review
05 Feb 2021 | | Contributor(s):: Arvind Raman
Atomic Force Microscopy is unique in its ability to measure sub -nanonewton forces arising from a variety physical phenomena between a sharp tip and a sample. In this talk we review the most recent applications of atomic force microscopy to explore and characterize quantitatively the properties...
Nanotechnology Workshops at Northwest Vista College - Nanotechnology Workshop for High School Students and High School Educators
26 Oct 2020 | | Contributor(s):: Neda Habibi, Jared Ashcroft (editor), The Micro Nano Technology - Education Center
Northwest Vista College will host it’s fourth summer Nanotechnology workshop for high school students and high school educators in summer 2021. ...
NNCI Outreach Demonstration Guide
10 Feb 2020 | | Contributor(s):: Nancy Healy, NNCI Nano
This compendium of demonstrations includes 17 activities that can be used to demonstrate topics to students and the general public. They are useful for science festivals, family science nights, and science cafes. ...
Quantum-Enhanced Imaging for Advanced Characterization
21 Jan 2020 | | Contributor(s):: Raphael C. Pooser
CDs and DVDs as Diffraction Gratings
13 Jan 2020 | | Contributor(s):: Rama Balachandran, Karen Porter Davis, NNCI Nano
The objective of this lab is to compare the diffraction behavior of light waves between a CD and DVD. CDs and DVDs contain regularly spaced micrometer sized features which can act like a diffraction grating. Using commercial electronic storage devices like CDs and DVDs as gratings rather than...
Seeing Nano II: Using Atomic Force Microscopy (AFM) to see Nano-size Objects
06 Jan 2020 | | Contributor(s):: Samantha Andrews, NNCI Nano
Students will explore the storage capacities of CDs, DVDs, and Blu-ray discs using an Atomic Force Microscope (AFM). The AFM allows us to image objects that are extremely small in size, often on the nanoscale (10-9m). Students will access an AFM via Remotely Accessible Instruments for...
Paven Thomas Mathew
Fundamentals of Metrology and Characterization for Nanotechnology
13 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network
Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it
3 min Research Talk: AFM And EBSD Cross-Comparison Analysis Tool
31 Jan 2019 | | Contributor(s):: Andrew Martin Krawec
This talk describes an approach to analyzing the crystal structure using data collected from AFM and EBSD scans to build an accurate image of the crystal structure and orientation in the ceramic
Surface Characterization at Nanoscale by means of AFM L1.1: Introduction and “Getting in Contact”
11 Nov 2018 | | Contributor(s):: Stanislav Leesment
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 1.
Surface Characterization at Nanoscale by means of AFM L1.2: Resonance Oscillatory Modes
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 2.
Surface Characterization at Nanoscale by means of AFM L1.3: Non-Resonant Oscillatory HybriD Mode
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 3.