Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Quantum-Enhanced Imaging for Advanced Characterization
21 Jan 2020 | | Contributor(s):: Raphael C. Pooser
CDs and DVDs as Diffraction Gratings
13 Jan 2020 | | Contributor(s):: Rama Balachandran, Karen Porter Davis
The objective of this lab is to compare the diffraction behavior of light waves between a CD and DVD. CDs and DVDs contain regularly spaced micrometer sized features which can act like a diffraction grating. Using commercial electronic storage devices like CDs and DVDs as gratings rather than...
Seeing Nano II: Using Atomic Force Microscopy (AFM) to see Nano-size Objects
06 Jan 2020 | | Contributor(s):: Samantha Andrews
Students will explore the storage capacities of CDs, DVDs, and Blu-ray discs using an Atomic Force Microscope (AFM). The AFM allows us to image objects that are extremely small in size, often on the nanoscale (10-9m). Students will access an AFM via Remotely Accessible Instruments for...
Paven Thomas Mathew
3 min Research Talk: AFM And EBSD Cross-Comparison Analysis Tool
31 Jan 2019 | | Contributor(s):: Andrew Martin Krawec
This talk describes an approach to analyzing the crystal structure using data collected from AFM and EBSD scans to build an accurate image of the crystal structure and orientation in the ceramic
Advanced Scanning Probe Microscopy I
01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
Advanced Scanning Probe Microscopy II
OutlinePart 1: Can be viewed hereOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: This LectureCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
AFM And EBSD Cross-Comparison Analysis Tool
14 Aug 2018 | | Contributor(s):: Andrew Martin Krawec, John Blendell, Matthew John Michie
Ceramic and semiconductor research is limited in its ability to create holistic representations of data in concise, easily-accessible file formats or visual data representations. These materials are used in everyday electronics, and optimizing their electrical and physical properties is...
Carbon Nanotube Counter
08 Aug 2018 | | Contributor(s):: Quinn Lennemann
Carbon Nanotube Counter (CNT Counter) is a program that can count the density of Carbon Nanotubes in microscope scans. The program supports JPEG and TIFF images from both Scanning Electron Microscopes (SEMs) and Atomic Force Microscopes (AFMs). This program contains both an automatic mode and a...
Advances in Ambient and Liquid AFM - Nanoscale Structure and Dynamics
08 Dec 2017 | | Contributor(s):: Roger Proksch
In this talk, we will explore some recent results in observations of structure and dynamics in a variety of systems ranging from polymer dynamics in ambient conditions, 3D atomic resolution mapping of the structure of the solid-liquid interface, defect dynamics in crystal lattice and biologically...
Learning Module: Microcantilevers - Instructor Materials
09 Feb 2017 | | Contributor(s):: Southwest Center for Microsystems Education (SCME)
This learning module is an overview of microcantilevers, how they work and how they are used in micro and nanotechnology. These are the instructor materials.
Learning Module: Microcantilevers
This learning module introduces you to the microcantilever, its applications in micro and nanotechnologies, its use in sensor arrays, and how it works in both static and dynamic modes of operation. There is a pre and post-test, four (4) informational units (PKs), and two (2)...
High Accuracy Atomic Force Microscope with Self-Optimizing Scan Control
19 Sep 2016 | | Contributor(s):: Ryan (Young-kook) Yoo
Atomic force microscope (AFM) is a very useful instrument in characterizing nanoscale features, However, the original AFM design, based on piezo-tube scanner, had slow response and non-orthogonal behavior, inadequate to address the metrology needs of industrial applications: accuracy,...
Jul 25 2016
International Conference on Non-Contact Atomic Force Microscopy
Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode
19 May 2016 |
Posted by Rostislav Vladimirovich Lapshin
R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI:...
Jhon Pazos Alonso
Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description
04 Dec 2015 |
Posted by Rostislav Vladimirovich Lapshin
R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...