Tags: defects

All Categories (1-18 of 18)

  1. Daniel M. Fleetwood

    Daniel M. Fleetwood received his B. S., M. S., and Ph. D. degrees in Physics from Purdue University in 1980, 1981, and 1984. Dan joined Sandia National Laboratories in Albuquerque, New Mexico, in...

    https://nanohub.org/members/416918

  2. FDNS21: Disorder and Defects in van der Waals Heterostructures

    11 May 2021 | | Contributor(s):: Daniel A Rhodes

  3. Machine Learning Defect Behavior in Semiconductors

    10 Nov 2020 | | Contributor(s):: Arun Kumar Mannodi Kanakkithodi, Rushik Desai (editor)

    Develop machine learning models to predict defect formation energies in chalcogenides

  4. Atomistic Green’s Functions: The Beauty of Self-energies

    28 Oct 2020 | | Contributor(s):: Tillmann Christoph Kubis

    This presentation gives an introduction to NEGF. It will be explained how self-energies cause NEGF to fundamentally differ from most other quantum methods. Atomistic examples of phonon and impurity scattering self-energies agree quantitatively with experiments.

  5. ME 290R Lecture 2.1: Lithography Performance Criteria - Technical

    27 Mar 2019 | | Contributor(s):: Taylor, Hayden

    Ways to evaluate a lithography process. Topics include: resolution; line edge roughness; overlay capability; throughput; cost of ownership; capital cost; energy consumption and environmental impact (e.g. solvent usage; material wastage); pattern dependencies.

  6. ME 290R Lecture 2.2: Lithography Performance Criteria - Technical (Yield Modeling)

    27 Mar 2019 | | Contributor(s):: Taylor, Hayden

    Ways to evaluate a lithography process. Topics include: resolution; line edge roughness; overlay capability; throughput; cost of ownership; capital cost; energy consumption and environmental impact (e.g. solvent usage; material wastage); pattern dependencies.

  7. MSEN 201 Lecture 8.1: Defects - Edge Dislocations

    13 Feb 2019 | | Contributor(s):: Patrick J Shamberger

  8. MSEN 201 Lecture 8.2: Defects - Screw Dislocations

    13 Feb 2019 | | Contributor(s):: Patrick J Shamberger

  9. MSEN 201 Lecture 8.3: Defects - Point Defects

    13 Feb 2019 | | Contributor(s):: Patrick J Shamberger

  10. Fundamentals of Phonon Transport Modeling L5: Phonon-Boundary and Phonon-Defect Scattering

    04 Jan 2017 | | Contributor(s):: Alan McGaughey, Xiulin Ruan

    Part of the 2016 IMECE Tutorial: Fundamentals of Phonon Transport Modeling: Formulation, Implementation, and Applications.

  11. Cu in CdTe Lab (2D Version)

    12 Jul 2016 | | Contributor(s):: Abdul Rawoof Shaik, Dragica Vasileska, Da Guo, Richard Akis

    2D diffusion-reaction simulator of Cu migration in polycrystaline CdTe solar cells with Grain Boundaries

  12. Muddiest Points: Crystal Defects and Burgers Vectors

    Collections | 01 Mar 2016 | Posted by Tanya Faltens

    https://nanohub.org/groups/materials/collections/videos--tensile-testing-dislocations-plastic-deformation

  13. Atefeh Nazary

    Atefeh Nazary received an M.S. degree in Electrical Engineering from Qazvin Islamic Azad University (QIAU), Qazvin, Iran, in 2015, and her B.S. degree in Electrical Engineering from Shariaty...

    https://nanohub.org/members/95665

  14. ECE 695A Lecture 18: DC-IV and Charge Pumping Methods

    25 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Recall: Properties of Interface DefectsFlux-based method 1: Direct Current-Voltage methodFlux-based method 2: Charge pumping methodConclusions

  15. ECE 695A Lecture 6: Defects in the Bulk and at Interfaces

    01 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Strain in materials/origin of defectsExamples: bulk defectsExamples: interface defectsMeasurementsConclusions

  16. ECE 695A Lecture 5: Amorphous Material/Interfaces

    29 Jan 2013 | | Contributor(s):: Muhammad Alam

    Outline:Amorphous vs. crystalline materialsDefect-free amorphous materialOrigin of defects (Maxwell’s relation)Conclusions

  17. Roman Nazarov

    https://nanohub.org/members/69136

  18. Ganesh Krishna Hegde

    https://nanohub.org/members/20954