Tags: electron microscopy

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Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

Online Presentations (1-20 of 45)

  1. Like Driving a Car: Acquiring Quality SEM/FESEM Images in Different Situations

    18 Nov 2022 | | Contributor(s):: Bangzhi Liu, NACK Network

    Getting good SEM/FESEM images is dependent on both the sample conditions (conductivity, bulk vs. thin film, etc) and the instrument’s imaging parameters (e.g., beam voltage, beam current, working distance, detector, etc).  This webinar will simplify and explain the complex nature...

  2. Transmission Electron Microscopy

    07 Oct 2022 | | Contributor(s):: Glen Johnson, NACK Network

  3. RAIN Network: Scanning Electron Microscope

    26 Sep 2022 | | Contributor(s):: Paul D. Asimow, The Micro Nano Technology - Education Center

  4. Characterization - Scanning Electron Microscopy

    11 Jan 2022 | | Contributor(s):: Atilla Ozgur Cakmak, NACK Network

  5. Fundamentals of Metrology and Characterization for Nanotechnology

    13 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network

    Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it

  6. Introduction to Scanning Electron Microscopy (SEM)

    10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

  7. Introduction to Field Emission Scanning Electron Microscopy (FESEM)

    10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

  8. Electron Microscopy

    24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlineScanning Electron MicroscopyField Emission Scanning Electron MicroscopyTransmission Electron MicroscopyEnergy Dispersive Spectroscopy

  9. The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale

    20 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network

    OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves

  10. Touching, Seeing, Chemically Detecting, and Hearing at our Size Scale

    19 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network

    OutlineCharacterizing materials and structures at our size scaleThe five sensesTouching at our size scaleSeeing at our size scaleChemically Detecting at our size scaleHearing at our size scaleIntroduction to Touching, Seeing, Chemically Detecting, and Hearing at the nano-scale

  11. [Illinois] AVS Meeting 2012: Photoelectron and Electron Spectro-Microscopy in Liquids and Dense Gaseous Environment Using Electron Transparent Membranes

    04 Jun 2013 | | Contributor(s):: Andrei Kolmakov

    Novel bottom-up designed materials currently constitute the major source of innovations in electronics, optics, energy harvesting/storage, catalysis and bio-medical applications. The performance of these new materials and devices depends on physicochemical processes taking place at the interface...

  12. ECET 499N Lecture 8: Electron Microscopy

    02 Mar 2010 | | Contributor(s):: Eric Stach

    Guest lecture: Eric A. Stach

  13. Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation

    18 Feb 2010 | | Contributor(s):: Klaus Schulten

  14. MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach

  15. MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach

  16. MSE 640 Lecture 13: Diffraction contrast imaging

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach

    Weak beam dark field imaging, Simulation of diffraction contrast

  17. MSE 640 Lecture 12: Diffraction contrast imaging, Part 1

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  18. MSE 640 Lecture 12: Diffraction contrast imaging, Part 2

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  19. MSE 640 Lecture 11: Diffraction contrast imaging

    out of 5 stars 

    29 May 2008 | | Contributor(s):: Eric Stach

    Thickness fringes, Bend contours, Planar faults

  20. MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)

    out of 5 stars 

    28 May 2008 | | Contributor(s):: Eric Stach