-
Like Driving a Car: Acquiring Quality SEM/FESEM Images in Different Situations
18 Nov 2022 | | Contributor(s):: Bangzhi Liu, NACK Network
Getting good SEM/FESEM images is dependent on both the sample conditions (conductivity, bulk vs. thin film, etc) and the instrument’s imaging parameters (e.g., beam voltage, beam current, working distance, detector, etc). This webinar will simplify and explain the complex nature...
-
Transmission Electron Microscopy
07 Oct 2022 | | Contributor(s):: Glen Johnson, NACK Network
-
RAIN Network: Scanning Electron Microscope
26 Sep 2022 | | Contributor(s):: Paul D. Asimow, The Micro Nano Technology - Education Center
-
Characterization - Scanning Electron Microscopy
11 Jan 2022 | | Contributor(s):: Atilla Ozgur Cakmak, NACK Network
-
Fundamentals of Metrology and Characterization for Nanotechnology
13 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network
Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it
-
Introduction to Field Emission Scanning Electron Microscopy (FESEM)
10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
-
Introduction to Scanning Electron Microscopy (SEM)
10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
-
Electron Microscopy
24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlineScanning Electron MicroscopyField Emission Scanning Electron MicroscopyTransmission Electron MicroscopyEnergy Dispersive Spectroscopy
-
The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale
20 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network
OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves
-
NACK Unit 6: Basic Characterization Techniques
19 Jul 2018 | | Contributor(s):: NACK Network
This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance.
-
Touching, Seeing, Chemically Detecting, and Hearing at our Size Scale
19 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network
OutlineCharacterizing materials and structures at our size scaleThe five sensesTouching at our size scaleSeeing at our size scaleChemically Detecting at our size scaleHearing at our size scaleIntroduction to Touching, Seeing, Chemically Detecting, and Hearing at the nano-scale
-
KRISHNANAND SAHADEV PRASAD SHUKLA
https://nanohub.org/members/199172
-
Himanshu Patel
https://nanohub.org/members/198194
-
Xiaohui Xu
https://nanohub.org/members/149988
-
Matthew Glen Robertson
https://nanohub.org/members/149764
-
Non-Rigid Registration for STEM
24 Sep 2015 |
This tool provides non-rigid registration and averaging of a series of scanning transmission electron microscopy images.
-
Sheng Ying Yue
https://nanohub.org/members/120281
-
IMOD online
09 Jun 2014 | | Contributor(s):: Mingxuan Lu, Chang Wan Han, Benjamin P Haley, Volkan Ortalan
Online IMOD tool for electron tomography
-
[Illinois] AVS Meeting 2012: Photoelectron and Electron Spectro-Microscopy in Liquids and Dense Gaseous Environment Using Electron Transparent Membranes
03 Jun 2013 | | Contributor(s):: Andrei Kolmakov
Novel bottom-up designed materials currently constitute the major source of innovations in electronics, optics, energy harvesting/storage, catalysis and bio-medical applications. The performance of these new materials and devices depends on physicochemical processes taking place at the interface...
-
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
25 Oct 2012 | | Contributor(s):: Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...