Tags: electron microscopy

Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

All Categories (1-20 of 65)

  1. Characterization - Scanning Electron Microscopy

    11 Jan 2022 | | Contributor(s):: Atilla Ozgur Cakmak, NACK Network

  2. Fundamentals of Metrology and Characterization for Nanotechnology

    13 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network

    Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it

  3. Introduction to Field Emission Scanning Electron Microscopy (FESEM)

    10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

  4. Introduction to Scanning Electron Microscopy (SEM)

    10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

  5. Electron Microscopy

    24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlineScanning Electron MicroscopyField Emission Scanning Electron MicroscopyTransmission Electron MicroscopyEnergy Dispersive Spectroscopy

  6. The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale

    20 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network

    OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves

  7. NACK Unit 6: Basic Characterization Techniques

    19 Jul 2018 | | Contributor(s):: NACK Network

    This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance.

  8. Touching, Seeing, Chemically Detecting, and Hearing at our Size Scale

    19 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network

    OutlineCharacterizing materials and structures at our size scaleThe five sensesTouching at our size scaleSeeing at our size scaleChemically Detecting at our size scaleHearing at our size scaleIntroduction to Touching, Seeing, Chemically Detecting, and Hearing at the nano-scale

  9. KRISHNANAND SAHADEV PRASAD SHUKLA

    https://nanohub.org/members/199172

  10. Himanshu Patel

    https://nanohub.org/members/198194

  11. Xiaohui Xu

    https://nanohub.org/members/149988

  12. Matthew Glen Robertson

    https://nanohub.org/members/149764

  13. Non-Rigid Registration for STEM

    24 Sep 2015 |

    This tool provides non-rigid registration and averaging of a series of scanning transmission electron microscopy images.

  14. Sheng Ying Yue

    https://nanohub.org/members/120281

  15. IMOD online

    09 Jun 2014 | | Contributor(s):: Mingxuan Lu, Chang Wan Han, Benjamin P Haley, Volkan Ortalan

    Online IMOD tool for electron tomography

  16. [Illinois] AVS Meeting 2012: Photoelectron and Electron Spectro-Microscopy in Liquids and Dense Gaseous Environment Using Electron Transparent Membranes

    03 Jun 2013 | | Contributor(s):: Andrei Kolmakov

    Novel bottom-up designed materials currently constitute the major source of innovations in electronics, optics, energy harvesting/storage, catalysis and bio-medical applications. The performance of these new materials and devices depends on physicochemical processes taking place at the interface...

  17. On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

    25 Oct 2012 | | Contributor(s):: Brian Demczyk

    This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...

  18. Nanoscale Dimensions in Hard Disk Media

    27 Sep 2012 | | Contributor(s):: Brian Demczyk

    This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant thickness to data zone takeoff. Also included is a model of disk wear.

  19. Nanostructure of Perpendicular Recording Media

    21 Sep 2012 | | Contributor(s):: Brian Demczyk

    This write up examines the nanostructure of successive generations of perpendicular recording media, with particular emphasis on defects and elemental segregation.

  20. Matt Schneider

    https://nanohub.org/members/66808