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Sai Sidhartha Hasti
https://nanohub.org/members/386208
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Many Body Effects on Optical Properties of Graphene
13 Oct 2016 | | Contributor(s):: Subhasis Ghosh
Graphene, a two-dimensional (2D) material shows remarkable optical and electronic properties, such as a linear energy dispersion, chirality and half-integer quantum Hall effect. Multilayer graphene flakes, held together by weak van der Waals forces have also attracted attention due to...
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Auger Generation as an Intrinsic Limit to Tunneling Field-Effect Transistor Performance
22 Sep 2016 | | Contributor(s):: Jamie Teherani
Many in the microelectronics field view tunneling field-effect transistors (TFETs) as society’s best hope for achieving a > 10× power reduction for electronic devices; however, despite a decade of considerable worldwide research, experimental TFET results have significantly...
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Computational and Experimental Study of Transport in Advanced Silicon Devices
28 Jun 2013 | | Contributor(s):: Farzin Assad
In this thesis, we study electron transport in advanced silicon devices by focusing on the two most important classes of devices: the bipolar junction transistor (BJT) and the MOSFET. In regards to the BJT, we will compare and assess the solutions of a physically detailed microscopic model to...
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ECE 695A Lecture 34: Scaling Theory of Design of Experiments
18 Apr 2013 | | Contributor(s):: Muhammad Alam
Outline:IntroductionBuckingham PI TheoremAn Illustrative ExampleRecall the scaling theory of HCI, NBTI, and TDDBConclusions
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ECE 695A Lecture 33: Model Selection/Goodness of Fit
18 Apr 2013 | | Contributor(s):: Muhammad Alam
Outline:The problem of matching data with theoretical distributionParameter extractions: Moments, linear regression, maximum likelihoodGoodness of fit: Residual, Pearson, Cox, AkikaConclusion
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ECE 695A Lecture 32: Physical vs. Empirical Distribution
17 Apr 2013 | | Contributor(s):: Muhammad Alam
Outline:Physical Vs. empirical distributionProperties of classical distribution functionMoment-based fitting of dataConclusions
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ECE 695A Lecture 31: Collecting and Plotting Data
15 Apr 2013 | | Contributor(s):: Muhammad Alam
Outline:Origin of data, Field Acceleration vs. Statistical InferenceNonparametric informationPreparing data for projection: Hazen formula Preparing data for projection: Kaplan formulaConclusion
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Nanoscale Transistors Lecture 7: Comparison to Experimental Results
19 Jul 2012 | | Contributor(s):: Mark Lundstrom
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Experiments and Models Regarding Strain Dependent Thermal Conductivity and Strength at the Nanoscale and Microscale
22 Sep 2011 | | Contributor(s):: Vikas Tomar
Silicon micro- and nano-structures are essential in today’s integrated circuits and sensors. The functioning and performance of such devices are highly affected by thermal properties. Due to the size effect, the thermal properties of bulk silicon cannot represent those of silicon...
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Quantum Computing - Experiments
15 Aug 2011 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck
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Quantum Coherent Effects in Photosynthesis
06 Aug 2011 | | Contributor(s):: K. Birgitta Whaley
I shall present and discuss theoretical studies of the quantum dynamics of a prototypical photosynthetic light harvesting complex, the Fenna-Matthews-Olson (FMO) complex, that analyze the nature and extent of two characteristic features of quantum processors, namely quantum speedup and quantum...
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Chemistry of Transition Metal Alloy Nanoparticles with Desired Phase Properties
20 Jun 2011 | | Contributor(s):: Lichang Wang
In this presentation, I will discuss the results of two alloy nanoparticles, PtAu and PtVFe. I will also present the synergetic results of unraveling PtVFe nanoparticles by coupling computational chemistry with experimental work.
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ME 597 Lecture 22: Frequency Modulated AFM: Experimental Details
14 Feb 2011 | | Contributor(s):: Ron Reifenberger
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Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization
24 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement
20 Jan 2011 | | Contributor(s):: Lee Stauffer
Introduction to Device Characterization -System Overview: System Architecture, Hardware Features and Software Features -Precision DC I-V Source-Measure Features and Concepts.
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Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 03: More KITE Setup and Features
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 04: Speed and Timing Considerations
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements
20 Jan 2011 | | Contributor(s):: Lee Stauffer