Tags: FinFET

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  1. Radiation Enabled Model Development and Validation

    08 Mar 2024 | | Contributor(s):: Jeffrey S. Kauppila

    This lecture will discuss techniques and methods for modeling single-event radiation effects at the transistor and circuit level. The lecture will also cover topics related to the validation of models using test data from custom on-chip measurement techniques developed over the last decade.

  2. SCALE Total Ionizing Dose Response Mechanisms in a 12-nm FinFET Technology

    21 Feb 2024 | | Contributor(s):: Hugh Barnaby

    This talk was also presented at the 2024 Microelectronics Reliability and Qualification Workshop, The Aerospace Corporation, El Segundo, CA, February, 6, 2024.

  3. Moore's Law and Radiation Effects on Microelectronics

    03 Oct 2023 | | Contributor(s):: Daniel M. Fleetwood

  4. SCALE Ion-Induced Stuck Bits in 5 nm Bulk FinFET SRAMs at High Fluences

    19 Sep 2023 | | Contributor(s):: Yoni Xiong

  5. ECE 606 L32.3: Modern MOSFET - Control of Threshold Voltage

    20 Jul 2023 | | Contributor(s):: Gerhard Klimeck

  6. ECE 606 L32.4: Modern MOSFET - Mobility Enhancement

    20 Jul 2023 | | Contributor(s):: Gerhard Klimeck

  7. EOLAS NEGF Transport Simulator

    18 May 2021 | | Contributor(s):: Alfonso Sanchez, Thomas Kelly

    Effective-mass / NEGF simulator for electronic transport in Si nanostructures

  8. nanoHUB MuGFET Tool Tutorial

    05 Mar 2021 | | Contributor(s):: Ashish anil Bait

    This is a basic tutorial on how to use the nanohub MuGFET tool to simulate FinFET or double gate model free of cost.

  9. Concept of FinFET Part-I

    05 Mar 2021 | | Contributor(s):: Ashish anil Bait

    Here is the video introducing latest transistor technology used in processors.

  10. Concept of FinFET Part-II

    05 Mar 2021 | | Contributor(s):: Ashish anil Bait

    Here is the video introducing latest transistor technology used in processors.

  11. Short Course on FinFET Simulation using MuGFET

    05 Mar 2021 | | Contributor(s):: Ashish anil Bait

    This short course present how to use nanohub MuGFET tool to simulate FinFET or double gate model. It provides a short background on FinFET followed by instructions on how to use the MuGFET tool for the FinFET simulation.

  12. A Single Atom Transistor: The Ultimate Scaling Limit – Entry into Quantum Computing

    14 Oct 2020 | | Contributor(s):: Gerhard Klimeck

    50th European Solid-State Device Research Conference

  13. 25 Linearity by Synthesis: An Intrinsically Linear AlGaN/GaN-on-Si Transistor with OIP3/(F-1)PDC of 10.1 at 30 GHz

    21 Sep 2020 | | Contributor(s):: Woojin Choi, Venkatesh Balasubramanian, Peter M. Asbeck, Shadi Dayeh

    The concept of an intrinsically synthesizable linear device is demonstrated. It was implemented by changing only the device layout; additional performance gains can be attained by further materials engineering.

  14. Neilalohith Sharma

    https://nanohub.org/members/257041

  15. Bandstructure Effects in Nano Devices With NEMO: from Basic Physics to Real Devices and to Global Impact on nanoHUB.org

    08 Mar 2019 | | Contributor(s):: Gerhard Klimeck

    This presentation will intuitively describe how bandstructure is modified at the nanometer scale and what some of the consequences are on the device performance.

  16. Siratun Nabi Sirat

    https://nanohub.org/members/186995

  17. I want to make a compact model for FinFET with Verilog-A to use it in HSpice, but I'm really new in this subject and don't know where to start. Can anyone help me with some documents in this subject?

    Q&A|Closed | Responses: 0

    https://nanohub.org/answers/question/1942

  18. Achintya Priydarshi

    https://nanohub.org/members/145038

  19. Contact Resistances in Trigate & FinFET Devices

    22 Mar 2016 | | Contributor(s):: Yann-Michel Niquet

    IWCE 2015 presentation.

  20. Study of the Interface Roughness Models using 3D Finite Element Schrödinger Equation Corrected Monte Carlo Simulator on Nanoscaled FinFET

    25 Jan 2016 | | Contributor(s):: Daniel Nagy, Muhammad Ali A. Elmessary, Manuel Aldegunde, Karol Kalna

    IWCE 2015 presentation.  Interface roughness scattering (IRS) is one of the key limiting scattering mechanism for both planar and non-planar CMOS devices. To predict the performance of future scaled devices and new structures the quantum mechanical confinement based IRS models are essential....