Tags: reliability

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  1. E3S Theme II: Nanomechanics eBook

    22 Feb 2020 | | Contributor(s):: Center for Energy Efficient Electronics Science (editor), Tsu-Jae King Liu, Farnaz Niroui, Edgar Acosta, Sergio Fabian Almeida, Vladimir Bulovic, Sara Fathipour, Jinchi Han, Jeffrey H. Lang, Mariana Martinez, Jose Mireles, Rawan Naous, Benjamin Osoba, Jatin Patil, Bivas Saha, Mayuran Saravanapavanantham, Urmita Sikder, Vladimir Stojanovic, Timothy Swager, Aldo Vidana, Junqiao Wu, Alice Ye, David Zubia

    This eBook was written by faculty, postdoctoral researchers, students, and staff of the Center for Energy Efficient Electronics Science (E3S). The Center is a consortium of five world-class academic institutions: University of California at Berkeley, Massachusetts Institute of Technology,...

  2. FeFET Memory Window Analytical Calculator

    16 Dec 2019 | | Contributor(s):: Nicolo Zagni, Paolo Pavan, Muhammad A. Alam

    This code computes the Memory Window of a FeFET by using the Landau-Devonshire theory. The aim of this code is to illustrate: the derivation of the switching conditions the trends of MW scaling with ferroelectric thickness the design constraints to guarantee hysteresis the effect of...

  3. Suns-Vmp Method

    04 Jun 2018 | | Contributor(s):: Xingshu Sun, Raghu Vamsi Krishna Chavali, Muhammad A. Alam

    This package contains the Matlab scripts to perform the Suns-Vmp method. The code has been tested in Matlab R2016a.