Tags: reliability

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  1. Transistors!

    04 Mar 2024 | | Contributor(s):: Mark Lundstrom

    As we begin a new era, in which making transistors smaller will no longer be a major driving force for progress, it is time to look back at what we have learned in transistor research. Today we see a need to convey as simply and clearly as possible the essential physics of the device that makes...

  2. Andrew L. Sternberg

    Andrew Sternberg received his B.S in Engineering Science from Lipscomb University in 1999, and a M.S and Ph.D. in Electrical Engineering from Vanderbilt University in 2003 and 2006 respectively. He...


  3. Shane Smith

    Dr. Shane Smith (Ph.D., Electrical and Computer Engineering, The Ohio State University) is a Research Scientist at the Ohio State University ElectroscienceLab and President and co-founder of...


  4. How to use PMI Models in Sentaurus TCAD simulator?

    Q&A|Closed | Responses: 0

    Hello everyone.

    I am looking for a guide (detailed if possible) on how to use Physical Model Interface (PMI) user field in Sentaurus Sdevice.

    The specific problem is: how to...


  5. E3S Theme II: Nanomechanics eBook

    22 Feb 2020 | | Contributor(s):: Center for Energy Efficient Electronics Science (editor), Tsu-Jae King Liu, Farnaz Niroui, Edgar Acosta, Sergio Fabian Almeida, Vladimir Bulovic, Sara Fathipour, Jinchi Han, Jeffrey H. Lang, Mariana Martinez, Jose Mireles, Rawan Naous, Benjamin Osoba, Jatin Patil, Bivas Saha, Mayuran Saravanapavanantham, Urmita Sikder, Vladimir Stojanovic, Timothy Swager, Aldo Vidana, Junqiao Wu, Alice Ye, David Zubia

    This eBook was written by faculty, postdoctoral researchers, students, and staff of the Center for Energy Efficient Electronics Science (E3S). The Center is a consortium of five world-class academic institutions: University of California at Berkeley, Massachusetts Institute of Technology,...

  6. FeFET Memory Window Analytical Calculator

    16 Dec 2019 | | Contributor(s):: Nicolo Zagni, Paolo Pavan, Muhammad A. Alam

    This code computes the Memory Window of a FeFET by using the Landau-Devonshire theory. The aim of this code is to illustrate: the derivation of the switching conditions the trends of MW scaling with ferroelectric thickness the design constraints to guarantee hysteresis the effect of...

  7. Big Data in Reliability and Security: Some Basics

    30 May 2019 | | Contributor(s):: Saurabh Bagchi

  8. Big Data in Reliability and Security: Applications

    30 May 2019 | | Contributor(s):: Saurabh Bagchi

  9. Robust Computing Systems: From Today to the N3XT 1,000×

    08 May 2019 | | Contributor(s):: Subhasish Mitra

    This talk presents an overview of my group’s research in the above areas, and particularly emphasizes complexity and performance.

  10. Birck Science Communication Shark Tank Compititon 2018

    17 Jan 2019 |

    The Science Communication Shark Tank competition and workshop gives students a chance to learn and train master storyteller skills in the best possible way: by playing a real-life game.

  11. Suns-Vmp Method

    04 Jun 2018 | | Contributor(s):: Xingshu Sun, Raghu Vamsi Krishna Chavali, Muhammad A. Alam

    This package contains the Matlab scripts to perform the Suns-Vmp method. The code has been tested in Matlab R2016a.

  12. Too hot to handle? The emerging challenge of reliability/variability in self-heated FintFET, ETSOI, and GAA-FET

    11 Jan 2016 | | Contributor(s):: Muhammad A. Alam, Sang Hoon Shin, Muhammad Abdul Wahab, Jiangjiang Gu, Jingyun Zhang, Peide "Peter" Ye

    This presentation is part of the 8th IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2015. It is difficult to control the geometry, doping, and thicknesses of small transistors. Moreover, nanoscale transistors degrade due to NBTI and HCI at vastly different...

  13. Failures in Photovoltaic Modules

    21 Apr 2015 | | Contributor(s):: Peter Bermel

    In this talk, I will discuss some of the major sources of performance degradation for common glass-encapsulated PV modules, including crystalline silicon and thin films. The greatest reliability challenges have occurred in the latter, with recent studies showing that thin-film modules operating...

  14. Long term Aging of Autonomous STructures (LAAST) Seminar Series

    07 Apr 2015 | | Contributor(s):: Ali Shakouri

    The Long term Aging of Autonomous STructures (LAAST) seminar series focuses on reliability and aging of devices for energy conversion, information processing or sensing.

  15. A Blind Fish in a River with a Waterfall

    23 Mar 2010 | | Contributor(s):: Muhammad Alam, Sajia Sadeque

    Prototype for a reliability problem defined as Stochastic Process with a Threshold

  16. Ali Aldubaisi


  17. Linfeng He


  18. ECE 695A Lecture 37: Radiation Induced Damage – An overview

    19 Apr 2013 | | Contributor(s):: Muhammad Alam

    Outline:Introduction and short history of radiation damageRadiation damage in various types of componentsSources of radiationA basic calculation and simulation approachesConclusions

  19. ECE 695A Lecture 37R: Review Questions

    19 Apr 2013 | | Contributor(s):: Muhammad Alam

    Review Questions:Why is SOI more radiation hard compared to bulk devices? What do you feel about radiation hardness of FINFET?What type of radiation issues could arise for thin-body devices like FINFET?What is error correction code? Why does it correct for MBU?What is the difference between SEE...

  20. ECE 695A Lecture 34: Scaling Theory of Design of Experiments

    18 Apr 2013 | | Contributor(s):: Muhammad Alam

    Outline:IntroductionBuckingham PI TheoremAn Illustrative ExampleRecall the scaling theory of HCI, NBTI, and TDDBConclusions