Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
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Scanning Probe Microscopy: "Feeling" What You Can't See at the Nanometer Scale
21 Jan 2020 | | Contributor(s):: Sandrine Martin, NNCI Nano
Scanning probe microscopes are important tools that allow researchers to examine nanoscale objects and materials. In this lesson, students simulate the function of a scanning probe microscope.This activity works best in groups of 3 students. Scanning Probe Microscopes (SPMs) of various types...
Modeling Sanning Probe Microscopes (SPM)
06 Jan 2020 | | Contributor(s):: Woodward Maxwell, NNCI Nano
The Modeling Scanning Probe Microscopes (SPM) lab is designed to show students the principles of how a Scanning Probe Microscope works and how mapping on a smaller scale provides a more detailed view of a surface. Students will use a conductivity apparatus to model the mapping behavior of an...
Operational Overview of the Veeco Innova Scanning Probe Microscope (SPM)
13 Oct 2018 |
Advanced Scanning Probe Microscopy I
01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode
19 May 2016 |
Posted by Rostislav Vladimirovich Lapshin
R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI:...
Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description
04 Dec 2015 |
Posted by Rostislav Vladimirovich Lapshin
R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...
Rostislav Vladimirovich Lapshin
MATLAB-based blind tip reconstruction algorithms
01 Aug 2014 | | Contributor(s):: Erin Flater, Charles Clifford
We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation", Journal of Research...
Corrosion Mechanisms in Magnetic Recording Media
29 Jul 2013 | | Contributor(s):: Brian Demczyk
This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.
Atomic Force Microscope Investigations of Lubrication Layers
26 Nov 2012 | | Contributor(s):: Brian Demczyk
This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.
Nanoscale Dimensions in Hard Disk Media
27 Sep 2012 | | Contributor(s):: Brian Demczyk
This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant thickness to data zone takeoff. Also included is a model of disk wear.
Chemically Enhanced Carbon-Based Nanomaterials and Devices
09 Nov 2010 | | Contributor(s):: Mark Hersam
Carbon-based nanomaterials have attracted significant attention due to their potential to enable and/or improve applications such as transistors, transparent conductors, solar cells, batteries, and biosensors. This talk will delineate chemical strategies for enhancing the electronic and optical...
ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)
12 Apr 2010 | | Contributor(s):: Helen McNally