Tags: scanning probe microscopy (SPM)

Description

Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.

Learn more about quantum dots from the many resources on this site, listed below. More information on Scanning probe microscopy can be found here.

All Categories (1-20 of 48)

  1. Scanning Probe Microscopy: "Feeling" What You Can't See at the Nanometer Scale

    21 Jan 2020 | | Contributor(s):: Sandrine Martin, NNCI Nano

    Scanning probe microscopes are important tools that allow researchers to examine nanoscale objects and materials. In this lesson, students simulate the function of a scanning probe microscope.This activity works best in groups of 3 students. Scanning Probe Microscopes (SPMs) of various types...

  2. Modeling Sanning Probe Microscopes (SPM)

    06 Jan 2020 | | Contributor(s):: Woodward Maxwell, NNCI Nano

    The Modeling Scanning Probe Microscopes (SPM) lab is designed to show students the principles of how a Scanning Probe Microscope works and how mapping on a smaller scale provides a more detailed view of a surface. Students will use a conductivity apparatus to model the mapping behavior of an...

  3. Operational Overview of the Veeco Innova Scanning Probe Microscope (SPM)

    13 Oct 2018 |

  4. Advanced Scanning Probe Microscopy I

    01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation

  5. Mark Joseph Hagmann

    https://nanohub.org/members/202580

  6. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode

    19 May 2016 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI:...

    https://nanohub.org/members/112015/blog/2016/05/research-article-drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in

  7. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description

    04 Dec 2015 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...

    https://nanohub.org/members/112015/blog/2015/12/drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in-nanometer-range-approach

  8. Kathy Walsh

    https://nanohub.org/members/119508

  9. Rostislav Vladimirovich Lapshin

    see www.lapshin.fast-page.org/biography.htm 

    https://nanohub.org/members/112015

  10. MATLAB-based blind tip reconstruction algorithms

    01 Aug 2014 | | Contributor(s):: Erin Flater, Charles Clifford

    We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation", Journal of Research...

  11. Rostislav Vladimirovich Lapshin

    Term: January 1996 – presentEmployer: Institute of Physical Problems named after F. V. LukinDepartment: NanoelectronicsLaboratory: Solid NanotechnologyAddress: passage 4806,...

    https://nanohub.org/members/105488

  12. Corrosion Mechanisms in Magnetic Recording Media

    29 Jul 2013 | | Contributor(s):: Brian Demczyk

    This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.

  13. Amin Vakhshouri

    I am a solid-state physicist, specialized in design, fabrication and electronic characterization of advanced materials using transport and scanning probe microscopy techniques. My research involved...

    https://nanohub.org/members/73806

  14. Atomic Force Microscope Investigations of Lubrication Layers

    26 Nov 2012 | | Contributor(s):: Brian Demczyk

    This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.

  15. Nanoscale Dimensions in Hard Disk Media

    27 Sep 2012 | | Contributor(s):: Brian Demczyk

    This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant thickness to data zone takeoff. Also included is a model of disk wear.

  16. Shan Yang

    https://nanohub.org/members/69536

  17. ROSHAN CHANDRA

    https://nanohub.org/members/60560

  18. Vsevolod Kosulnikov

    https://nanohub.org/members/56242

  19. Chemically Enhanced Carbon-Based Nanomaterials and Devices

    09 Nov 2010 | | Contributor(s):: Mark Hersam

    Carbon-based nanomaterials have attracted significant attention due to their potential to enable and/or improve applications such as transistors, transparent conductors, solar cells, batteries, and biosensors. This talk will delineate chemical strategies for enhancing the electronic and optical...

  20. ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)

    12 Apr 2010 | | Contributor(s):: Helen McNally