X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials

29 Dec 2009 | Online Presentations | Contributor(s): Mauro Sardela

A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the …

http://nanohub.org/resources/7955

Illinois ME 498 Introduction of Nano Science and Technology, Lecture 18: Enabling tools for Characterization of Nanoscale Materials

17 Nov 2009 | Online Presentations | Contributor(s): Nick Fang, Omar N Sobh

Enabling tools for nanoscale materials Topics: Vapor - Liquid - Solid Nanowire Growth Anodizing Alumina as Template Sensing with Nanowires Imagning with Energy Beams Scanning electron …

http://nanohub.org/resources/7843