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Túlio André Pereira
Matthew Glen Robertson
Andrew Joseph O'Connor
Gustavo Medeiros Azevedo
Michael James Walock
X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials
29 Dec 2009 | Online Presentations | Contributor(s): Mauro Sardela
A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the...
Illinois ME 498 Introduction of Nano Science and Technology, Lecture 18: Enabling tools for Characterization of Nanoscale Materials
17 Nov 2009 | Online Presentations | Contributor(s): Nick Fang, Omar N Sobh
Enabling tools for nanoscale materials
Vapor - Liquid - Solid Nanowire Growth
Anodizing Alumina as Template
Sensing with Nanowires
Imagning with Energy Beams