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TÃºlio AndrÃ© Pereira
Matthew Glen Robertson
Andrew Joseph O'Connor
Gustavo Medeiros Azevedo
Michael James Walock
X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials
29 Dec 2009 | | Contributor(s):: Mauro Sardela
A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the Birck Nanotechnology Center. Practical aspects of data acquisition and interpretation using x-ray...
Illinois ME 498 Introduction of Nano Science and Technology, Lecture 18: Enabling tools for Characterization of Nanoscale Materials
17 Nov 2009 | | Contributor(s):: Nick Fang, Omar N Sobh
Enabling tools for nanoscale materialsTopics: Vapor - Liquid - Solid Nanowire Growth Anodizing Alumina as Template Sensing with Nanowires Imagning with Energy Beams Scanning electron Microscopy (SEM) Electron Sources Field Emission Principle Limitations of the Beam Size Liquid Metal Ion Source...