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XPS lite: Introduction to CasaXPS – Birck Nanotechnology Events
Thursday, April 12, 2012 @ 09:00 am EDT — Friday, April 13, 2012 @ 01:00 pm EDT
BRK 1001


Course Objectives:

• Learn main physics principles of X-ray Photoelectron Spectroscopy (XPS);
• Learn what analysis/treatment should be applied to raw XPS data;
• Learn CasaXPS software;
• Learn approaches for qualitative and quantitative analysis of XPS data using CasaXPS;
• Case studies based on participant's XPS data


Course Description

XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard technique for the characterization of solid surface. However, XPS data require thorough analysis, and dedicated software is used for data analysis. Purdue University has a site license for CasaXPS allowing complete analysis XPS data. The course aims to teach (1) what analysis should be applied to raw XPS data and (2) how this can be done using CasaXPS. Qualitative and quantitative analysis of XPS data using CasaXPS will be discussed in detail as well. Participants are encouraged to bring their own laptops to follow data analysis using CasaXPS.


Dmitry Zemlyanov, Surface Science Application Scientist, Birck Nanotechnology Center, Purdue University.


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