Thursday, April 12, 2012 @ 09:00 am EDT — Friday, April 13, 2012 @ 01:00 pm EDT | ||||
BRK 1001 | ||||
Course Objectives: • Learn main physics principles of X-ray Photoelectron Spectroscopy (XPS);
Course DescriptionXPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard technique for the characterization of solid surface. However, XPS data require thorough analysis, and dedicated software is used for data analysis. Purdue University has a site license for CasaXPS allowing complete analysis XPS data. The course aims to teach (1) what analysis should be applied to raw XPS data and (2) how this can be done using CasaXPS. Qualitative and quantitative analysis of XPS data using CasaXPS will be discussed in detail as well. Participants are encouraged to bring their own laptops to follow data analysis using CasaXPS. InstructorDmitry Zemlyanov, Surface Science Application Scientist, Birck Nanotechnology Center, Purdue University. More Information |
||||
Export to My Calendar (ics) |