Nanotechnology and Surface Science Applications
Online Presentations | 27 Nov 2018 | Contributor(s): Dmitry Zemlyanov
Surface Characterization Facility at Birck Nanotechnology Center, BRK 1077
Chemical and Electronic Properties of Solid Surfaces
Online Presentations | 01 Nov 2018 | Contributor(s): Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano‐materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...
Characterization of 2D materials at Birck Surface Analysis Facility
Online Presentations | 28 Sep 2016 | Contributor(s): Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...
Nanotechnology for Aerospace Research: Surface Science Applications
Online Presentations | 29 Mar 2016 | Contributor(s): Dmitry Zemlyanov
Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray...
XPS Thickness Solver
Tools | 18 Dec 2011 | Contributor(s): Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin
Helps the user to determine the thickness of an overlayer material from XPS experiment data.
BME 695L Special Lecture 2: X-ray Photoelectron Spectroscopy (XPS) in Biologically-Relevant Applications
Online Presentations | 01 Nov 2011 | Contributor(s): Dmitry Zemlyanov
Guest lecturer: Dmitry Zemlyanov
Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG
Online Presentations | 30 Jan 2010 | Contributor(s): Dmitry Zemlyanov
In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to...
X-ray Photoelectron Spectroscopy (XPS) Tour
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Online Presentations | 24 Jan 2008 | Contributor(s): Dmitry Zemlyanov
A guided tour, given by Dmitry Zemlyanov, of the X-ray Photoelectron Spectroscopy (XPS) lab located in the Birck Nanotechnology Center at Purdue University.
BME 695N Lecture 12: Introduction to X-ray Photoelectron Spectroscopy and the Examples of Biologically-Relevant Applications
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Online Presentations | 19 Oct 2007 | Contributor(s): Dmitry Zemlyanov
With Dmitry Zemlyanov as guest lecturer.
Introduction to X-ray Photoelectron Spectroscopy and to XPS Applications
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Online Presentations | 17 May 2007 | Contributor(s): Dmitry Zemlyanov
X-ray Photoelectron Spectroscopy (XPS), which is known as Electron Spectroscopy for Chemical Analysis (ESCA), is a powerful research tool for the study of the surface of solids. The technique is widely used for studies of the properties of atoms, molecules, solids, and surfaces. The...
Introduction to X-ray Photoelectron Spectroscopy and XPS Application for Biologically Related Objects
Online Presentations | 14 Feb 2007 | Contributor(s): Dmitry Zemlyanov
X-ray Photoelectron Spectroscopy (XPS), which is known as Electron Spectroscopy for Chemical Analysis (ESCA), is a powerful research tool for the study of the surface of solids. The technique becomes widely used for studies of the properties of atoms, molecules, solids, and surfaces. The main...