[Illinois] 6th Advanced Materials Characterization (AMC) Workshop 2012

By NanoBio Node

University of Illinois at Urbana-Champaign

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Abstract


AMC 2012: 6th Advanced Materials Characterization Workshop

This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will cover the following techniques:

  • Atomic force microscopy (AFM).
  • X-ray diffraction, reflectivity and fluorescence (XRD, XRR, XRF) including high-temperature analysis.
  • Scanning and transmission electron microscopy (SEM, TEM, STEM); focused ion beam (FIB).
  • Auger electron spectroscopy (AES), and x-ray photoelectron spectroscopy (XPS).
  • Secondary ion mass spectrometry (SIMS), and Rutherford backscattering (RBS).
  • Optical spectroscopy (Raman, Photoluminescence, FTIR, ellipsometry, etc.).
  • Optical microscopy (confocal microscopy, near-field scanning optical microscopy, Raman microscopy, etc.).
  • Nanoindentation analysis (including nano electric contact resistance, acoustic emission, and nano dynamical mechanical analysis)..
  • Biological materials: tutorial on sample prep and analysis of biological material.

Lectures will be presented by scientists with extensive academic and industrial experience in each technique. The following topics will be covered:

  • A short review of the fundamentals of each analytical technique.
  • Critical review of strengths and weaknesses of each technique: how to combine techniques to extract the best possible complementary information.
    • >

  • Comparative review of the instrumentation options with emphasis on differences in resolution, sensitivity, detection limits, sample requirements.
  • Data acquisition strategies and data processing methods..
  • Expert tips on how to avoid measurement artifacts.
  • Detailed discussion of practical examples including industrial applications in areas such as nanotechnology, microelectronics, thin films, coatings, bioengineering, mineralogy, medical, and pharmaceutical research.

Sponsored by

Platinum Sponsors:

AIST-NT,

Horiba Scientific,

Micro Materials,

Zeiss
Asylum,

Hysitron,

Princeton Instruments

Sponsors:

AFM Workshop,

American Vacuum Society,

Bruker,

Chemplex,

JEOL USA,

Kurt J. Lesker Company,

Olympus,

Oxford Instruments,

Thermo Scientific,

Zygo,

Agilent Technologies,

Angstrom Scientific,

Cameca,

FEI Company,

Kratos Analytical,

Oerlikon Leybold Vacuum,

Ophir Photonics,

Panalytical,

Witec

Cite this work

Researchers should cite this work as follows:

  • NanoBio Node (2013), "[Illinois] 6th Advanced Materials Characterization (AMC) Workshop 2012," https://nanohub.org/resources/18203.

    BibTex | EndNote

Time

Location

Engineering Sciences Building, University of Illinois at Urbana-Champaign, Urbana, IL

Tags

  1. AMC 2012
  2. Illinois
  3. Imaging
  4. material characterization
  5. Microscopes
  6. microscopy
  7. NanoBio Node at Illinois
  8. nano technology

In This Workshop

  1. [Illinois] Advanced Materials Characterization Workshop 2012: Nanofabrication of Plasmonic Devices in the Helium Ion Microscope

    05 Jul 2012 | Online Presentations | Contributor(s): Larry Scipioni

    Helium ion microscopy (HIM) is being used both to create and to inspect nanostructures for photonic and plasmonic devices. As part of a program exploring photoelectrons as sources for multiple beam electron beam lithography, fractal apertures are being developed to generate a sub-20nm light...

  2. [Illinois] Advanced Materials Characterization Workshop 2012: Nano-Impact For Investigation Of Low Cycle Fatigue For Optimization Of Cutting Tool Coating At Ambient and Elevated Temperatures

    05 Jul 2012 | Online Presentations | Contributor(s): Mike Davies

    Recent improvements in nanomechanical test techniques to encompass a greater range of test temperatures (to 750 deg C) and strain rates (up to 10^-3 - 10^-4 s^-1) have opened up the exciting possibility of obtaining design rules for coating properties to provide improved durability under the...

  3. [Illinois] Advanced Materials Characterization Workshop 2012: The Schmidt-Czerny-Turner Spectrograph

    05 Jul 2012 | Online Presentations | Contributor(s): Jason McClure

    The Czerny-Turner type imaging spectrograph is by far the most commonly usedresearch instrument in dispersive optical spectroscopy. Image aberrations inherent inthis type spectrograph impart distortions to recorded spectra that affect resolution bothspatially and spectrally. Understanding the...

  4. [Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 4: X-ray Diffraction and Reflectometry

    05 Jul 2012 | Online Presentations | Contributor(s): Mauro Sardela

    This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will cover the following techniques:Atomic force microscopy (AFM)X-ray diffraction, reflectivity and...

  5. [Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 3: X-ray Electron Spectroscopy / Auger Electron Spectroscopy

    05 Jul 2012 | Online Presentations | Contributor(s): Rick Haasch

    This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will cover the following techniques:Atomic force microscopy (AFM)X-ray diffraction, reflectivity and...

  6. [Illinois] Advanced Materials Characterization Workshop 2012: Advanced AFM-Raman Setup - Towards The Spatial and Spectroscopic Resolution At Single Molecule Level

    05 Jul 2012 | Online Presentations | Contributor(s): Alexey Temiryazev

    Significant advances in Scanning Probe Microscopy (SPM) during the last decade have allowed true molecular resolution in vacuum, liquid and ambient conditions. The next step in the development of this technology is to make molecular resolution imaging a reliably attainable by...

  7. [Illinois] Advanced Materials Characterization Workshop 2012: AM-FM and Loss Tangent Imaging, Two Tools for Quant. Nanomechanical Property Mapping

    05 Jul 2012 | Online Presentations | Contributor(s): Irene Revenko

    Amplitude-modulated Atomic Force Microscopy (AM-AFM), also known as tapping mode, is a proven, reliable and gentle imaging method with wide spread applications. Previously, the contrast in AM-AFM has been difficult to quantify. In this work, we introduce two new techniques that allow unambiguous...

  8. [Illinois] Advanced Materials Characterization Workshop 2012: Technical Requirements For Successful Tip Enhanced Raman (TERS) Imaging: Towards Label-Free Chemical Imaging At The Nano-scale

    05 Jul 2012 | Online Presentations | Contributor(s): Emmanuel Leroy

    Since the mid 1980’s, Scanning Probe Microscopy has been a catalyst for research on nanotechnologies,making the study of nano-materials affordable, and has greatly enhanced the analysis of mechanical andelectrical properties of those materials, yet it has limited chemical specificity.Raman...

  9. [Illinois] Advanced Materials Characterization Workshop 2012: Recent Developments in a Novel Dynamical Testing Technique

    05 Jul 2012 | Online Presentations | Contributor(s): Jeffrey Schirer

    Nanomechanical testing, often nanoindentation, has been well-established at a basic level for characterization of small volumes of material and low-dimensional structures, with the size scale of the applications dictating the physical testing size scale required. The aspiration to understand...