Hot Carrier Degradation Universal Scaling

By Xin Jin

Purdue University

This tool involves discovering the universality of the HCI damage

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Version 1.0 - published on 15 Jan 2015

doi:10.4231/D3804XK98 cite this

This tool is closed source.

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Usage

World usage

Location of all "Hot Carrier Degradation Universal Scaling" Users Since Its Posting

Cumulative Simulation Users

36

5 5 15 16 16 16 16 16 18 18 18 18 18 18 18 20 21 21 21 21 21 21 21 21 21 21 22 23 24 24 24 24 24 24 25 26 26 26 26 26 26 26 27 28 28 28 29 29 29 30 30 31 32 33 33 35 35 35 35 35 35 35 35 36 36 36 36

Users By Organization Type
Type Users
Unidentified 17 (47.22%)
Educational - University 17 (47.22%)
Industry 1 (2.78%)
Unemployed 1 (2.78%)
Users by Country of Residence
Country Users
us UNITED STATES 11 (61.11%)
in INDIA 2 (11.11%)
cn CHINA 1 (5.56%)
tn TUNISIA 1 (5.56%)
de GERMANY 1 (5.56%)
jp JAPAN 1 (5.56%)
tw TAIWAN 1 (5.56%)

Simulation Runs

129

11 11 46 65 81 81 81 81 83 83 96 96 96 96 96 99 101 101 101 101 101 101 101 101 101 101 103 105 107 107 107 107 107 107 109 111 111 111 111 111 111 111 114 116 116 116 120 120 120 121 121 123 124 126 126 128 128 128 128 128 128 128 128 129 129 129 129
Overview
Average Total
Wall Clock Time 1.09 hours 3.37 days
CPU time 2.06 seconds 2.54 minutes
Interaction Time 19.81 minutes 1.02 days