Hot Carrier Degradation Universal Scaling

By Xin Jin

Purdue University

This tool involves discovering the universality of the HCI damage

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Version 1.0 - published on 15 Jan 2015

doi:10.4231/D3804XK98 cite this

This tool is closed source.

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Usage

World usage

Location of all "Hot Carrier Degradation Universal Scaling" Users Since Its Posting

Simulation Users

24

5 5 15 16 16 16 16 16 18 18 18 18 18 18 18 20 21 21 21 21 21 21 21 21 21 21 22 23 24 24 24 24 24

Users By Organization Type
Type Users
Educational - University 16 (66.67%)
Unidentified 6 (25%)
Industry 1 (4.17%)
Unemployed 1 (4.17%)
Users by Country of Residence
Country Users
us UNITED STATES 11 (64.71%)
tn TUNISIA 1 (5.88%)
de GERMANY 1 (5.88%)
jp JAPAN 1 (5.88%)
tw TAIWAN 1 (5.88%)
cn CHINA 1 (5.88%)
in INDIA 1 (5.88%)

Simulation Runs

110

11 11 46 65 81 81 81 81 83 83 96 96 96 96 96 99 102 102 102 102 102 102 102 102 102 102 105 108 110 110 110 110 110
Overview
Average Total
Wall Clock Time 1.2 hours 3.31 days
CPU time 2.25 seconds 2.48 minutes
Interaction Time 21.65 minutes 23.82 hours