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2D material reflectance spectra
Simulation of the reflectance spectra of 2D materials and image analysis for thickness identification
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Abstract
Introduction
2dreflect offers two main functions:
- Simulation of the reflectance spectra of a customized stack of 2D materials
- Thickness labeling using model-based spectral image analysis
Major features
Simulation:
- User-defined stack of up to 5 films, one material with an arbitrary thickness in each film
- 2D materials available in each film in the stack: MoS2, WS2, MoSe2, WSe2, hBN and graphene
- Thickness dependency of n, k of TMDCs (MoS2, WS2, MoSe2 and WSe2) is automatically taken into account when film thickness is specified
- Multiple spectra can be displayed on the same plot for convenient comparison
Thickness labeling:
- Thickness of interest, +/- 1 monolayer, are highlighted if they appear in the field of view
- Labeling based on up to 3 spectral images (user specifies the central wavelength for each image)
- Convenient switching between label map and error map to evaluate the fidelity of the labels
Please refer to the User Guide for more information.
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Credits
Li, Wan, et al. "Direct optical visualization of graphene and its nanoscale defects on transparent substrates." Nano letters16.8 (2016): 5027-5031.
Cite this work
Researchers should cite this work as follows:
-
Vu Nguyen, Wan Li, Ke Xu and Hayden Taylor (2019), "2D material reflectance spectra"