2D material reflectance spectra

Simulation of the reflectance spectra of 2D materials and image analysis for thickness identification

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Version 2.0 - published on 24 Jun 2020

doi:10.21981/04NF-EM42 cite this

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    Simulation tab User recording uploaded images Thickness identification tab Error map Material options Substrate options

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Abstract

Introduction

2dreflect offers two main functions:

    - Simulation of the reflectance spectra of a customized stack of 2D materials

    - Thickness labeling using model-based spectral image analysis

 

Major features

Simulation:

    - User-defined stack of up to 5 films, one material with an arbitrary thickness in each film

    - 2D materials available in each film in the stack: MoS2, WS2, MoSe2, WSe2, hBN and graphene

    - Thickness dependency of n, k of TMDCs (MoS2, WS2, MoSe2 and WSe2) is automatically taken into account when film thickness is specified 

    - Multiple spectra can be displayed on the same plot for convenient comparison

 

Thickness labeling:

    - Thickness of interest, +/- 1 monolayer, are highlighted if they appear in the field of view

    -  Labeling based on up to 3 spectral images (user specifies the central wavelength for each image)

    - Convenient switching between label map and error map to evaluate the fidelity of the labels

 

Please refer to the User Guide for more information.

 

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Credits

Li, Wan, et al. "Direct optical visualization of graphene and its nanoscale defects on transparent substrates." Nano letters16.8 (2016): 5027-5031.

Cite this work

Researchers should cite this work as follows:

  • Vu Nguyen, Wan Li, Ke Xu and Hayden Taylor (2019), "2D material reflectance spectra" 

  • Vu Dang Nguyen, Yunsu Park, Darren K Adams, Hayden Taylor (2020), "2D material reflectance spectra," https://nanohub.org/resources/2dreflect. (DOI: 10.21981/04NF-EM42).

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