Seeing Nano II: Using Atomic Force Microscopy (AFM) to see Nano-size Objects
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Abstract
Students will explore the storage capacities of CDs, DVDs, and Blu-ray discs using and Atomic Force Microscope (AFM). The AFM allows us to image objects that are extremely small in size, often on the nanoscale (10-9m). Students will access an AFM via Remotely Accessible Instruments for Nanotechnology (RAIN). RAIN is a free service to educators that allows students to access and control microscopes (http://nano4me.org/remoteaccess). Students control the tools over the Internet in real-time and with the assistance of an experienced engineer at the microscope advising over video conferencing software.
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Credits
Samantha Andrews
Sponsored by
National Nanotechnology Infrastructure Network NSF ECCS 0335765 and Southeastern Nanotechology Infrasstrcture Corridor NSF ECCS 1542174
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Submitter
Georgia Insitute of Technology, Atlanta, GA